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基于相位测量偏折术的批量镜面平面度测量

Batch Specular Plane Flatness Measurements Based on Phase Measuring Deflectometry.

作者信息

Li Zhuotong, Wang Dongxue, Liu Lei, Zhang Xiaodong

机构信息

State Key Laboratory of Precision Measuring Technology & Instruments, Laboratory of MicroNano Manufacturing Technology, Tianjin University, Tianjin 300072, China.

出版信息

Sensors (Basel). 2024 Apr 24;24(9):2693. doi: 10.3390/s24092693.

Abstract

Flatness is a critical parameter in the manufacturing industry, directly impacting the fit and overall product performance. As the efficiency of manufacturing continues to advance, there is an increasing demand for more accurate and efficient measurement techniques. Existing methods often struggle to strike a balance between precision and efficiency. In response, this article introduces a novel approach that is capable of achieving high-precision and rapid measurements concerning multiple surfaces. By enhancing the traditional phase measuring deflectometry (PMD) method, employing a matching technique based on polar lines and normal vector constraints to address discrete surface measurement challenges, and implementing a plane pre-positioning method to tackle low efficiency in binocular matching and solving, we successfully performed swift and synchronized measurements for a large batch of specular surfaces and obtained the three-dimensional surface profile of each measured surface. Through experimental validation, the method proposed in this paper can perform the batch measurement of specular planes while maintaining high measurement accuracy.

摘要

平面度是制造业中的一个关键参数,直接影响配合精度和产品整体性能。随着制造效率的不断提高,对更精确、高效的测量技术的需求日益增加。现有方法往往难以在精度和效率之间取得平衡。对此,本文介绍了一种新颖的方法,该方法能够对多个表面进行高精度快速测量。通过改进传统的相位测量偏折术(PMD)方法,采用基于极线和法向量约束的匹配技术来解决离散表面测量难题,并实施平面预定位方法来解决双目匹配和解算效率低下的问题,我们成功地对大量镜面表面进行了快速同步测量,并获得了每个被测表面的三维表面轮廓。通过实验验证,本文提出的方法能够在保持高测量精度的同时对镜面平面进行批量测量。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/34e5/11085605/27c11a6d267d/sensors-24-02693-g001.jpg

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