Luo Xuemin, Jiao Yanhui, Li Hang, Liu Qi, Liu Jinfeng, Wang Mingwei, Liu Yong
State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, International School of Materials Science and Engineering (ISMSE), State Wuhan University of Technology, Wuhan 430070, China.
Materials (Basel). 2024 May 7;17(10):2190. doi: 10.3390/ma17102190.
Transition metal dichalcogenides (TMDs), particularly monolayer TMDs with direct bandgap properties, are key to advancing optoelectronic device technology. WSe stands out due to its adjustable carrier transport, making it a prime candidate for optoelectronic applications. This study explores monolayer WSe synthesis via H-assisted CVD, focusing on how carrier gas flow rate affects WSe quality. A comprehensive characterization of monolayer WSe was conducted using OM (optical microscope), Raman spectroscopy, PL spectroscopy, AFM, SEM, XPS, HRTEM, and XRD. It was found that H incorporation and flow rate critically influence WSe's growth and structural integrity, with low flow rates favoring precursor concentration for product formation and high rates causing disintegration of existing structures. This research accentuates the significance of fine-tuning the carrier gas flow rate for optimizing monolayer WSe synthesis, offering insights for fabricating monolayer TMDs like WS, MoSe, and MoS, and facilitating their broader integration into optoelectronic devices.
过渡金属二硫属化物(TMDs),特别是具有直接带隙特性的单层TMDs,是推动光电器件技术发展的关键。WSe因其可调节的载流子传输而脱颖而出,使其成为光电子应用的主要候选材料。本研究探索了通过H辅助化学气相沉积法合成单层WSe,重点关注载气流量如何影响WSe的质量。使用光学显微镜(OM)、拉曼光谱、光致发光光谱(PL光谱)、原子力显微镜(AFM)、扫描电子显微镜(SEM)、X射线光电子能谱(XPS)、高分辨率透射电子显微镜(HRTEM)和X射线衍射(XRD)对单层WSe进行了全面表征。研究发现,H的掺入和流量对WSe的生长和结构完整性有至关重要的影响,低流量有利于前驱体浓度以形成产物,而高流量则会导致现有结构的分解。本研究强调了微调载气流量对优化单层WSe合成的重要性,为制造诸如WS、MoSe和MoS等单层TMDs提供了见解,并促进它们更广泛地集成到光电器件中。