Schürmann Robin, Gaál Anikó, Sikora Aneta, Ojeda David, Bartczak Dorota, Goenaga-Infante Heidi, Korpelainen Virpi, Sauvet Bruno, Deumer Jérôme, Varga Zoltán, Gollwitzer Christian
Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany.
Research Centre for Natural Sciences, Institute of Materials and Environmental Chemistry, H-1117 Budapest, Hungary.
Nanotechnology. 2024 Jul 1;35(38). doi: 10.1088/1361-6528/ad568b.
Biomedical analytical applications, as well as the industrial production of high-quality nano- and sub-micrometre particles, require accurate methods to quantify the absolute number concentration of particles. In this context, small-angle x-ray scattering (SAXS) is a powerful tool to determine the particle size and concentration traceable to the Système international d'unités (SI). Therefore, absolute measurements of the scattering cross-section must be performed, which require precise knowledge of all experimental parameters, such as the electron density of solvent and particles, whereas the latter is often unknown. Within the present study, novel SAXS-based approaches to determine the size distribution, density and number concentrations of sub-micron spherical silica particles with narrow size distributions and mean diameters between 160 nm and 430 nm are presented. For the first-time traceable density and number concentration measurements of silica particles are presented and current challenges in SAXS measurements such as beam-smearing, poorly known electron densities and moderately polydisperse samples are addressed. In addition, and for comparison purpose, atomic force microscopy has been used for traceable measurements of the size distribution and single particle inductively coupled plasma mass spectrometry with the dynamic mass flow approach for the accurate quantification of the number concentrations of silica particles. The possibilities and limitations of the current approaches are critically discussed in this study.
生物医学分析应用以及高质量纳米和亚微米颗粒的工业生产都需要精确的方法来量化颗粒的绝对数浓度。在这种情况下,小角X射线散射(SAXS)是一种强大的工具,可用于确定可溯源至国际单位制(SI)的颗粒尺寸和浓度。因此,必须进行散射截面的绝对测量,这需要精确了解所有实验参数,例如溶剂和颗粒的电子密度,而后者通常是未知的。在本研究中,提出了基于SAXS的新方法,用于确定尺寸分布狭窄、平均直径在160纳米至430纳米之间的亚微米球形二氧化硅颗粒的尺寸分布、密度和数浓度。首次给出了二氧化硅颗粒的可溯源密度和数浓度测量结果,并解决了SAXS测量中的当前挑战,如光束模糊、电子密度未知和中等多分散样品等问题。此外,为了进行比较,原子力显微镜已用于尺寸分布的可溯源测量,单颗粒电感耦合等离子体质谱结合动态质量流方法用于精确量化二氧化硅颗粒的数浓度。本研究对当前方法的可能性和局限性进行了批判性讨论。