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基于ControlNet和Swin Transformer的自动印刷电路板样本生成与缺陷检测

Automatic PCB Sample Generation and Defect Detection Based on ControlNet and Swin Transformer.

作者信息

Liu Yulong, Wu Hao, Xu Youzhi, Liu Xiaoming, Yu Xiujuan

机构信息

School of Mechanical Engineering, Anhui University of Technology, Maanshan 243032, China.

出版信息

Sensors (Basel). 2024 May 28;24(11):3473. doi: 10.3390/s24113473.

DOI:10.3390/s24113473
PMID:38894263
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11175188/
Abstract

In order to improve the efficiency and accuracy of multitarget detection of soldering defects on surface-mounted components in Printed Circuit Board (PCB) fabrication, we propose a sample generation method using Stable Diffusion Model and ControlNet, as well as a defect detection method based on the Swin Transformer. The method consists of two stages: First, high-definition original images collected in industrial production and the corresponding prompts are input to Stable Diffusion Model and ControlNet for automatic generation of nonindependent samples. Subsequently, we integrate Swin Transformer as the backbone into the Cascade Mask R-CNN to improve the quality of defect features extracted from the samples for accurate detection box localization and segmentation. Instead of segmenting individual components on the PCB, the method inspects all components in the field of view simultaneously over a larger area. The experimental results demonstrate the effectiveness of our method in scaling up nonindependent sample datasets, thereby enabling the generation of high-quality datasets. The method accurately recognizes targets and detects defect types when performing multitarget inspection on printed circuit boards. The analysis against other models shows that our improved defect detection and segmentation method improves the Average Recall (AR) by 2.8% and the mean Average Precision (mAP) by 1.9%.

摘要

为了提高印刷电路板(PCB)制造中表面贴装元件焊接缺陷多目标检测的效率和准确性,我们提出了一种使用稳定扩散模型和ControlNet的样本生成方法,以及一种基于Swin Transformer的缺陷检测方法。该方法包括两个阶段:首先,将工业生产中收集的高清原始图像和相应的提示输入到稳定扩散模型和ControlNet中,以自动生成非独立样本。随后,我们将Swin Transformer作为主干集成到Cascade Mask R-CNN中,以提高从样本中提取的缺陷特征的质量,从而实现精确的检测框定位和分割。该方法不是对PCB上的单个元件进行分割,而是在更大的区域内同时检查视野中的所有元件。实验结果证明了我们的方法在扩大非独立样本数据集方面的有效性,从而能够生成高质量的数据集。该方法在对印刷电路板进行多目标检测时能够准确识别目标并检测缺陷类型。与其他模型的分析表明,我们改进的缺陷检测和分割方法将平均召回率(AR)提高了2.8%,将平均精度均值(mAP)提高了1.9%。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/71eeec3dcd2e/sensors-24-03473-g009a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/68f53b68b0eb/sensors-24-03473-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/495da93f5fbb/sensors-24-03473-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/1ef7c68eaa57/sensors-24-03473-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/025f98ad2cc5/sensors-24-03473-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/96766c16cbbf/sensors-24-03473-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/4870cfab2525/sensors-24-03473-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/a8386cabfac7/sensors-24-03473-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/ea0497945d90/sensors-24-03473-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/71eeec3dcd2e/sensors-24-03473-g009a.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/68f53b68b0eb/sensors-24-03473-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/495da93f5fbb/sensors-24-03473-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/1ef7c68eaa57/sensors-24-03473-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/025f98ad2cc5/sensors-24-03473-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/96766c16cbbf/sensors-24-03473-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/4870cfab2525/sensors-24-03473-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/a8386cabfac7/sensors-24-03473-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/ea0497945d90/sensors-24-03473-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/dfdd/11175188/71eeec3dcd2e/sensors-24-03473-g009a.jpg

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