Li Baoli, Hu Xiaonan, Mu Zhiwen, Cheng Ke, Gu Min, Fang Xinyuan
School of Artificial Intelligence Science and Technology, University of Shanghai for Science and Technology, Shanghai 200093, China.
Institute of Photonic Chips, University of Shanghai for Science and Technology, Shanghai 200093, China.
Nano Lett. 2024 Jul 17;24(28):8679-8686. doi: 10.1021/acs.nanolett.4c02063. Epub 2024 Jul 1.
The simultaneous detection of the orbital angular momentum (OAM) and wavelength offers new opportunities for optical multiplexing. However, because of the dispersion of lens functions for Fourier transformation, the mode conversions at distinct wavelengths cannot be achieved in the same plane. Here we propose an ultracompact achromatic complementary metal oxide semiconductor (CMOS)-integrated OAM mode detector. Specifically, a spatial multiplexed scheme, randomly interleaving the phase distributions for distributing the superposed OAM modes into preset positions at distinct wavelengths, is presented. In addition, such a nanoprinted achromatic OAM detector featuring a microscale size and a short focal length can be integrated onto a CMOS chip. Consequently, the four-bit incident light beams at three discrete wavelengths (633, 532, and 488 nm) can be distinguished with a high degree of accuracy evaluated by the average standardized Euclidean distance of ∼0.75 between the analytical and target results. Our results showcase a miniaturized platform for achieving high-capacity information processing.
同时检测轨道角动量(OAM)和波长为光复用提供了新的机遇。然而,由于傅里叶变换透镜功能的色散,不同波长下的模式转换无法在同一平面内实现。在此,我们提出一种超紧凑型消色差互补金属氧化物半导体(CMOS)集成OAM模式探测器。具体而言,提出了一种空间复用方案,通过随机交错相位分布,将叠加的OAM模式在不同波长下分布到预设位置。此外,这种具有微尺度尺寸和短焦距的纳米印刷消色差OAM探测器可集成到CMOS芯片上。因此,通过分析结果与目标结果之间约0.75的平均标准化欧几里得距离评估,能够以高精度区分三个离散波长(633、532和488 nm)下的四位入射光束。我们的结果展示了一个用于实现高容量信息处理的小型化平台。