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用于发光二极管和激光二极管精确光学测量的平均差分连续脉冲法

Mean Differential Continuous Pulse Method for Accurate Optical Measurements of Light-Emitting Diodes and Laser Diodes.

作者信息

Zong Yuqin, Hulett Jeff, Koide Naomasa, Yamaji Yoshiki, Miller C Cameron

机构信息

Sensor Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

Vektrex Electronic Systems, Inc., San Diego, CA 92121, USA.

出版信息

J Res Natl Inst Stand Technol. 2021 Nov 23;126:126034. doi: 10.6028/jres.126.034. eCollection 2021.

Abstract

Limited sources exist for the application of germicidal ultraviolet (GUV) radiation. Ultraviolet light-emitting diodes (UV-LEDs) have significantly improved in efficiency and are becoming another viable source for GUV. We have developed a mean differential continuous pulse method (M-DCP method) for optical measurements of light-emitting diodes (LEDs) and laser diodes (LDs). The new M-DCP method provides an improvement on measurement uncertainty by one order of magnitude compared to the unpublished differential continuous pulse method (DCP method). The DCP method was already a significant improvement of the continuous pulse method (CP method) commonly used in the LED industry. The new M-DCP method also makes it possible to measure UV-LEDs with high accuracy. Here, we present the DCP method, discuss the potential systematic error sources in it, and present the M-DCP method along with its reduced systematic errors. This paper also presents the results of validation measurement of LEDs using the M-DCP method and common test instruments.

摘要

用于杀菌紫外线(GUV)辐射的光源有限。紫外线发光二极管(UV-LED)的效率有了显著提高,正成为GUV的另一种可行光源。我们开发了一种用于发光二极管(LED)和激光二极管(LD)光学测量的平均差分连续脉冲法(M-DCP法)。与未发表的差分连续脉冲法(DCP法)相比,新的M-DCP法将测量不确定度提高了一个数量级。DCP法已经是LED行业常用的连续脉冲法(CP法)的重大改进。新的M-DCP法还使高精度测量UV-LED成为可能。在此,我们介绍DCP法,讨论其中潜在的系统误差源,并介绍M-DCP法及其降低的系统误差。本文还展示了使用M-DCP法和普通测试仪器对LED进行验证测量的结果。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/458a/10914384/2f1a687671f5/jres-Image001.jpg

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