d'Acapito F, Rehman M A
Consiglio Nazionale delle Ricerche, Istituto Officina dei Materiali - OGG, c/o ESRF, Grenoble, France.
Department of Chemical and Materials Engineering, New Uzbekistan University, Tashkent, Uzbekistan.
J Synchrotron Radiat. 2024 Sep 1;31(Pt 5):1078-1083. doi: 10.1107/S1600577524005484. Epub 2024 Jul 23.
The simulation of EXAFS spectra of thin films via ab initio methods is discussed. The procedure for producing the spectra is presented as well as an application to a two-dimensional material (WSe) where the effectiveness of this method in reproducing the spectrum and the linear dichroic response is shown. A series of further examples in which the method has been employed for the structural determination of materials are given.
讨论了通过从头算方法对薄膜的扩展X射线吸收精细结构(EXAFS)光谱进行模拟。介绍了生成光谱的过程,以及该方法在二维材料(WSe)中的应用,展示了此方法在再现光谱和线性二向色性响应方面的有效性。还给出了一系列该方法用于材料结构测定的进一步示例。