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使用静电力显微镜测定空气中CYTOP薄膜的表面电荷密度和电荷映射。

Determination of Surface Charge Density and Charge Mapping of CYTOP Film in Air using Electrostatic Force Microscopy.

作者信息

Singh Shalini, Weber Stefan A L, Mallick Dhiman, Goswami Ankur

机构信息

School of Interdisciplinary Research, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India.

Institute for Photovoltaics, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart, Germany.

出版信息

Langmuir. 2024 Aug 6;40(31):16330-16337. doi: 10.1021/acs.langmuir.4c01504. Epub 2024 Jul 25.

Abstract

Cyclic transparent optical polymer (CYTOP), a fluoropolymer, finds a plethora of applications in microelectronic devices for sustainable energy harvesting and memory devices. By and large, these devices demand high voltage breakdown, a high dielectric constant, transparency, charge storage, and retention capabilities. Despite many efforts, comprehensive investigation of the charge distribution, retention, and discharge studies conducted on the CYTOP film at the micro-scale remains elusive. Here, we present direct quantification and mapping of surface charge on the CYTOP surface at room temperature using two different modes of advanced surface probe microscopy i.e., Kelvin probe force microscopy (KPFM) and electrostatic force microscopy (EFM). We estimated that the surface charge densities of the CYTOP film using EFM are 1.4 and 3.3 μC/cm for the injection of positive and negative charges, respectively. Furthermore, we determined the charge retention time for both injected positive and negative charges. We found that the retention capacity of the negative charges on the CYTOP film is much higher as compared to the positive charges. Moreover, it is also observed that injected negative charges are strongly localized on the CYTOP surface compared to the positive counterpart. Additionally, we demonstrated that charge writing is possible on the CYTOP surface using the AFM conductive tip. These results may find potential applications in energy harvesting, sensing, memory devices, security, and surveillance.

摘要

环状透明光学聚合物(CYTOP)是一种含氟聚合物,在用于可持续能量收集的微电子器件和存储器件中有大量应用。总体而言,这些器件需要高击穿电压、高介电常数、透明度、电荷存储和保持能力。尽管付出了很多努力,但在微观尺度上对CYTOP薄膜进行的电荷分布、保持和放电研究的全面调查仍然难以实现。在此,我们使用两种不同模式的先进表面探针显微镜,即开尔文探针力显微镜(KPFM)和静电力显微镜(EFM),在室温下对CYTOP表面的表面电荷进行了直接定量和映射。我们估计,使用EFM注入正电荷和负电荷时,CYTOP薄膜的表面电荷密度分别为1.4和3.3 μC/cm²。此外,我们确定了注入的正电荷和负电荷的电荷保持时间。我们发现,CYTOP薄膜上负电荷的保持能力比正电荷高得多。此外,还观察到与正电荷相比,注入的负电荷在CYTOP表面上强烈局域化。此外,我们证明了使用原子力显微镜导电尖端可以在CYTOP表面进行电荷写入。这些结果可能在能量收集、传感、存储器件、安全和监视等方面找到潜在应用。

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