Influence of Compression Loading on Acoustic Emission and Light Polarization Features in TeO Crystal.

Monitoring the processes inside crystalline materials under their operating conditions is of great interest in optoelectronics and scientific instrumentation. Early defect detection ensures the proper functioning of multiple crystal-based devices. In this study, a combination of acoustic emission (AE) sensing and cross-polarization imaging is proposed for the fast characterization of the crystal's structure. For the experiments, tellurium dioxide (TeO) crystal was chosen due to its wide use in acousto-optics. Studies were performed under uniaxial compression loading with a simultaneous acquisition of AE signals and four polarized optical images. An analysis of the temporal dependencies of the AE data and two-dimensional maps of the light depolarization features was carried out in order to establish quantitative criteria for irreversible damage initiation and crack-like defect formation. The obtained results reveal the polarization image patterns and the AE pulse duration alteration specific to these processes, and they open up new possibilities for non-destructively monitoring in real-time the structure of optically transparent crystals under their operating conditions.