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在大气压下使用形成气体对β-GaO进行无等离子体各向异性选择性区域蚀刻。

Plasma-free anisotropic selective-area etching of β-GaO using forming gas under atmospheric pressure.

作者信息

Oshima Takayoshi, Togashi Rie, Oshima Yuichi

机构信息

Research Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, Japan.

Department of Engineering and Applied Sciences, Sophia University, Chiyoda-ku, Japan.

出版信息

Sci Technol Adv Mater. 2024 Jul 26;25(1):2378683. doi: 10.1080/14686996.2024.2378683. eCollection 2024.

DOI:10.1080/14686996.2024.2378683
PMID:39081843
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11288204/
Abstract

We demonstrate a facile and safe anisotropic gas etching technique for β-GaO under atmospheric pressure using forming gas, a H/N gas mixture containing 3.96 vol% H. This etching gas, being neither explosive nor toxic, can be safely exhausted into the atmosphere, simplifying the etching system setup. Thermodynamic calculations confirm the viability of gas-phase etching above 676°C without the formation of Ga droplets. Experimental verification was achieved by etching ( 02) β-GaO substrates within a temperature range of 700-950°C. Moreover, selective-area etching using this method yielded trenches and fins with vertical and flat sidewalls, defined by (100) facets with the lowest surface energy density, demonstrating significant anisotropic etching capability.

摘要

我们展示了一种简便且安全的常压下对β-GaO进行各向异性气体蚀刻的技术,该技术使用的是含3.96体积%氢气的H₂/N₂混合气体(即形成气体)。这种蚀刻气体既不爆炸也无毒,可以安全地排放到大气中,简化了蚀刻系统的设置。热力学计算证实了在676°C以上进行气相蚀刻且不形成镓液滴的可行性。通过在700 - 950°C的温度范围内蚀刻(02)β-GaO衬底实现了实验验证。此外,使用该方法进行的选择性区域蚀刻产生了具有垂直和平坦侧壁的沟槽和鳍片,这些由具有最低表面能密度的(100)面界定,展现出显著的各向异性蚀刻能力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/d2929f2b24b8/TSTA_A_2378683_F0005_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/19812fe238f0/TSTA_A_2378683_UF0001_B.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/a25ff6a49c71/TSTA_A_2378683_F0001_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/5841682bb362/TSTA_A_2378683_F0002_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/facd432f0a02/TSTA_A_2378683_F0003_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/460bfdf08d38/TSTA_A_2378683_F0004_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/d2929f2b24b8/TSTA_A_2378683_F0005_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/19812fe238f0/TSTA_A_2378683_UF0001_B.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/a25ff6a49c71/TSTA_A_2378683_F0001_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/5841682bb362/TSTA_A_2378683_F0002_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/facd432f0a02/TSTA_A_2378683_F0003_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/460bfdf08d38/TSTA_A_2378683_F0004_OC.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcf5/11288204/d2929f2b24b8/TSTA_A_2378683_F0005_OC.jpg

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本文引用的文献

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J Phys Chem Lett. 2022 Aug 4;13(30):7094-7099. doi: 10.1021/acs.jpclett.2c02167. Epub 2022 Jul 28.
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ACS Nano. 2019 Aug 27;13(8):8784-8792. doi: 10.1021/acsnano.9b01709. Epub 2019 Jun 24.