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一名Xp11.23 - p11.22区域存在4.5Mb新型微缺失的患者出现不明原因的反复发热和不明原因菌血症。

Recurrent fever of unknown origin and unexplained bacteremia in a patient with a novel 4.5 Mb microdeletion in Xp11.23-p11.22.

作者信息

Lee Cho-Rong, Kim Man Jin, Park Sang-Heon, Kim Sheehyun, Kim Soo Yeon, Koh Seong-Joon, Lee Seungbok, Choi Murim, Chae Jong Hee, Park Sung-Gyoo, Moon Jangsup

机构信息

College of Pharmacy, Institute of Pharmaceutical Sciences, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul, 08826, Republic of Korea.

Department of Genomic Medicine, Seoul National University Hospital, 101 Daehak-ro, Jongno-gu, Seoul, 03080, Republic of Korea.

出版信息

Sci Rep. 2024 Aug 1;14(1):17801. doi: 10.1038/s41598-024-65341-5.

Abstract

Fever of unknown origin (FUO) remains a formidable diagnostic challenge in the field of medicine. Numerous studies suggest an association between FUO and genetic factors, including chromosomal abnormalities. Here, we report a female patient with a 4.5 Mb Xp microdeletion, who presented with recurrent FUO, bacteremia, colitis, and hematochezia. To elucidate the underlying pathogenic mechanism, we employed a comprehensive approach involving single cell RNA sequencing, T cell receptor sequencing, and flow cytometry to evaluate CD4 T cells. Analysis of peripheral blood mononuclear cells revealed augmented Th1, Th2, and Th17 cell populations, and elevated levels of proinflammatory cytokines in serum. Notably, the patient exhibited impaired Treg cell function, possibly related to deletion of genes encoding FOPX3 and WAS. Single cell analysis revealed specific expansion of cytotoxic CD4 T lymphocytes, characterized by upregulation of various signature genes associated with cytotoxicity. Moreover, interferon-stimulated genes were upregulated in the CD4 T effector memory cluster. Further genetic analysis confirmed maternal inheritance of the Xp microdeletion. The patient and her mother exhibited X chromosome-skewed inactivation, a potential protective mechanism against extensive X chromosome deletions; however, the mother exhibited complete skewing and the patient exhibited incomplete skewing (85:15), which may have contributed to emergence of immunological symptoms. In summary, this case report describes an exceptional instance of FUO stemming from an incompletely inactivated X chromosome microdeletion, thereby increasing our understanding of the genetics underpinning FUO.

摘要

不明原因发热(FUO)在医学领域仍然是一个严峻的诊断挑战。大量研究表明FUO与遗传因素之间存在关联,包括染色体异常。在此,我们报告一名患有4.5 Mb Xp微缺失的女性患者,她出现反复不明原因发热、菌血症、结肠炎和便血。为了阐明潜在的致病机制,我们采用了一种综合方法,包括单细胞RNA测序、T细胞受体测序和流式细胞术来评估CD4 T细胞。外周血单核细胞分析显示Th1、Th2和Th17细胞群体增加,血清中促炎细胞因子水平升高。值得注意的是,该患者表现出调节性T细胞功能受损,可能与编码FOXP3和WAS的基因缺失有关。单细胞分析显示细胞毒性CD4 T淋巴细胞特异性扩增,其特征是与细胞毒性相关的各种特征基因上调。此外,干扰素刺激基因在CD4 T效应记忆簇中上调。进一步的基因分析证实了Xp微缺失的母系遗传。患者及其母亲表现出X染色体偏斜失活,这是一种针对广泛X染色体缺失的潜在保护机制;然而,母亲表现出完全偏斜,而患者表现出不完全偏斜(85:15),这可能导致了免疫症状的出现。总之,本病例报告描述了一例由不完全失活的X染色体微缺失引起的不明原因发热的特殊病例,从而增加了我们对不明原因发热遗传学基础的理解。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e8bc/11294525/e07b31683393/41598_2024_65341_Fig1_HTML.jpg

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