Adaka Alex, Rajabi Mojtaba, Haputhantrige Nilanthi, Sprunt Samuel, Lavrentovich Oleg D, Jákli Antal
Materials Science Graduate Program, <a href="https://ror.org/049pfb863">Kent State University</a>, Kent, Ohio 44242, USA.
Advanced Materials and Liquid Crystal Institute, <a href="https://ror.org/049pfb863">Kent State University</a>, Kent, Ohio 44242, USA.
Phys Rev Lett. 2024 Jul 19;133(3):038101. doi: 10.1103/PhysRevLett.133.038101.
The recently discovered ferroelectric nematic (N_{F}) liquid crystals (LC) have been reported to show an extraordinarily large value of the real part of the dielectric constant (ϵ^{'}>10^{3}) at low frequencies. However, it was argued by Clark et al. in Phys. Rev. Res. 6, 013195 (2024)PPRHAI2643-156410.1103/PhysRevResearch.6.013195 that what was measured was the capacitance of the insulating layer at LC or electrode surface and not that of the liquid crystal. Here we describe the results of dielectric spectroscopy measurements of an N_{F} material in cells with variable thickness of the insulating layers. Our measurements quantitatively verify the model by Clark et al. Additionally, our measurements in cells with bare conducting indium tin oxide surface provide a crude estimate of ϵ_{⊥}∼10^{2} in the N_{F} phase.
据报道,最近发现的铁电向列相(Nₑ)液晶(LC)在低频下的介电常数实部呈现出极大的值(ε′>10³)。然而,克拉克等人在《物理评论研究》6, 013195 (2024) [PPRHAI2643 - 156410.1103/PhysRevResearch.6.013195] 中指出,所测量的是液晶或电极表面绝缘层的电容,而非液晶本身的电容。在此,我们描述了在具有可变厚度绝缘层的盒中对一种Nₑ材料进行介电谱测量的结果。我们的测量定量地验证了克拉克等人提出的模型。此外,我们在具有裸露导电氧化铟锡表面的盒中的测量提供了Nₑ相中ε⊥ ∼ 10²的粗略估计。