Rhodes T L, Peebles W A, Zeng Lei, Hall-Chen Valerian, Ronald Kevin, Kubota S, Meng Yusong, Lantsov R, Michael C M, Crocker N A, Scannell R
Department of Physics and Astronomy, University of California, Los Angeles, California 90095, USA.
Institute of High Performance Computing, Agency for Science, Technology and Research (A*STAR), Singapore.
Rev Sci Instrum. 2024 Aug 1;95(8). doi: 10.1063/5.0219578.
Validated and accurate edge profiles (temperature, density, etc.) are vitally important to the Mega Ampere Spherical Tokamak Upgrade (MAST-U) divertor and confinement effort. Density profile reflectometry has the potential to significantly add to the measurement capabilities currently available on MAST-U (e.g., Thomson scattering and Langmuir probes). This work presents the diagnostic requirements, problems, and solutions facing profile reflectometry in spherical tokamaks and MAST-U in particular. Requirements include density measurements near zero electron density in the scrape off layer region, coverage for a broad range of MAST-U plasma parameters, high time (≤10 microseconds) and spatial resolutions (≤1 cm), reliability, and identification of the plasma start frequency.
经过验证且准确的边缘轮廓(温度、密度等)对于兆安球形托卡马克升级装置(MAST-U)的偏滤器和约束研究至关重要。密度轮廓反射测量法有潜力显著增强MAST-U目前可用的测量能力(例如,汤姆逊散射和朗缪尔探针)。这项工作介绍了球形托卡马克尤其是MAST-U中轮廓反射测量法所面临的诊断要求、问题及解决方案。要求包括在刮离层区域接近零电子密度处进行密度测量、覆盖MAST-U广泛的等离子体参数范围、高时间分辨率(≤10微秒)和空间分辨率(≤1厘米)、可靠性以及识别等离子体起始频率。