Polkovnikov V N, Chkhalo N I, Garakhin S A, Salashchenko N N, Zuev S Yu
Opt Lett. 2024 Aug 15;49(16):4577-4580. doi: 10.1364/OL.534480.
The paper reports on a new Zr/Be/Si/Al multilayer structure that provides record reflectances of up to 67% and a spectral resolution of Δλ = 0.63 nm (λ / Δλ ≈ 27) in the spectral range of 17-20 nm. It is shown that the structure has a high temporal stability of extreme ultraviolet (EUV) optical characteristics. This fact makes the structure promising for future missions to study the solar corona.
该论文报道了一种新型Zr/Be/Si/Al多层结构，在17 - 20纳米的光谱范围内，其反射率高达67%，创历史记录，光谱分辨率为Δλ = 0.63纳米（λ /Δλ≈27）。研究表明，该结构在极紫外（EUV）光学特性方面具有很高的时间稳定性。这一特性使得该结构在未来研究日冕的任务中具有广阔的应用前景。
