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采用磁束自旋编码的倒易空间方法的中性束显微镜。

Neutral beam microscopy with a reciprocal space approach using magnetic beam spin encoding.

作者信息

Lowe Morgan, Alkoby Yosef, Chadwick Helen, Alexandrowicz Gil

机构信息

Department of Chemistry, Faculty of Science and Engineering, Swansea University, Swansea, SA2 8PP, UK.

出版信息

Nat Commun. 2024 Aug 15;15(1):7046. doi: 10.1038/s41467-024-51175-2.

DOI:10.1038/s41467-024-51175-2
PMID:39147745
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11327282/
Abstract

The emerging technique of neutral beam microscopy offers a non-perturbative way of imaging surfaces of various materials which cannot be studied using conventional microscopes. Current neutral beam microscopes use either diffractive focusing or pin-hole scanning to achieve spatial resolution, and are characterised by a strong dependence of the imaging time on the required resolution. In this work we introduce an alternative method for achieving spatial resolution with neutral atom beams which is based on manipulating the magnetic moments of the beam particles in a gradient field, and is characterised by a much weaker dependence of the imaging time on the image resolution. The validity of the imaging approach is demonstrated experimentally by reconstructing one dimensional profiles of the beam which are in good agreement with numerical simulation calculations. Numerical simulations are used to demonstrate the dependence of the signal to noise on the scan resolution and the topography of the sample, and assess the broadening effect due to the spread of velocities of the beam particles. The route towards implementing magnetic encoding in high resolution microscopes is discussed.

摘要

新兴的中性束显微镜技术提供了一种对各种材料表面进行成像的非侵入性方法,而这些材料是传统显微镜无法研究的。当前的中性束显微镜使用衍射聚焦或针孔扫描来实现空间分辨率,其特点是成像时间强烈依赖于所需的分辨率。在这项工作中,我们介绍了一种利用中性原子束实现空间分辨率的替代方法,该方法基于在梯度场中操纵束粒子的磁矩,其特点是成像时间对图像分辨率的依赖性要弱得多。通过重建与数值模拟计算高度吻合的束的一维轮廓,实验证明了成像方法的有效性。数值模拟用于证明信噪比与扫描分辨率和样品形貌的关系,并评估束粒子速度扩散引起的展宽效应。还讨论了在高分辨率显微镜中实现磁编码的途径。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/385aee08b043/41467_2024_51175_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/71afdf6c57a7/41467_2024_51175_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/4ad4b75f3150/41467_2024_51175_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/89177aa2b95d/41467_2024_51175_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/2ef6541dc7c8/41467_2024_51175_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/2a367f8aab09/41467_2024_51175_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/385aee08b043/41467_2024_51175_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/71afdf6c57a7/41467_2024_51175_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/4ad4b75f3150/41467_2024_51175_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/89177aa2b95d/41467_2024_51175_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/2ef6541dc7c8/41467_2024_51175_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/2a367f8aab09/41467_2024_51175_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6f42/11327282/385aee08b043/41467_2024_51175_Fig6_HTML.jpg

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本文引用的文献

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2D Helium Atom Diffraction from a Microscopic Spot.来自微观光斑的二维氦原子衍射。
Phys Rev Lett. 2023 Dec 8;131(23):236202. doi: 10.1103/PhysRevLett.131.236202.
2
Neutral helium atom microscopy.中性氦原子显微镜。
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3
Sub-resolution contrast in neutral helium microscopy through facet scattering for quantitative imaging of nanoscale topographies on macroscopic surfaces.中性氦显微镜中的亚分辨率对比度通过面散射实现,用于对宏观表面上的纳米级形貌进行定量成像。
Nat Commun. 2023 Feb 17;14(1):904. doi: 10.1038/s41467-023-36578-x.
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Measuring surface phonons using molecular spin-echo.利用分子自旋回波测量表面声子。
Phys Chem Chem Phys. 2022 Jun 15;24(23):14198-14208. doi: 10.1039/d2cp01372j.
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Stopping molecular rotation using coherent ultra-low-energy magnetic manipulations.利用相干超低能量磁操控停止分子旋转。
Nat Commun. 2022 Apr 28;13(1):2287. doi: 10.1038/s41467-022-29830-3.
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Low-energy electron ionization mass spectrometer for efficient detection of low mass species.低能电子电离质谱仪,用于高效检测低质量物质。
Rev Sci Instrum. 2021 Jul 1;92(7):073305. doi: 10.1063/5.0050292.
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