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在欧洲X射线自由电子激光装置上比较碳化硼和硅的单次损伤阈值。

Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL.

作者信息

Tavakkoly Marziyeh, Chalupsky Jaromir, Hajkova Vera, Hillert Wolfgang, Jelinek Simon, Juha Libor, Makita Mikako, Mazza Tommaso, Meyer Michael, Montano Jacobo, Sinn Harald, Vozda Vojtech, Vannoni Maurizio

机构信息

Institute of Experimental Physics, Universitat Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany.

FZU - Institute of Physics, Czech Academy of Sciences, Na Slovance 2, 18221 Prague 8, Czechia.

出版信息

J Synchrotron Radiat. 2024 Sep 1;31(Pt 5):1067-1070. doi: 10.1107/S1600577524007318. Epub 2024 Aug 25.

DOI:10.1107/S1600577524007318
PMID:39182203
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11371029/
Abstract

Xray free-electron lasers (XFELs) enable experiments that would have been impractical or impossible at conventional X-ray laser facilities. Indeed, more XFEL facilities are being built and planned, with their aim to deliver larger pulse energies and higher peak brilliance. While seeking to increase the pulse power, it is quintessential to consider the maximum pulse fluence that a grazing-incidence FEL mirror can withstand. To address this issue, several studies were conducted on grazing-incidence damage by soft X-ray FEL pulses at the European XFEL facility. Boron carbide (BC) coatings on polished silicon substrate were investigated using 1 keV photon energy, similar to the X-ray mirrors currently installed at the soft X-ray beamlines (SASE3). The purpose of this study is to compare the damage threshold of BC and Si to determine the advantages, tolerance and limits of using BC coatings.

摘要

X射线自由电子激光(XFEL)使一些在传统X射线激光设施中不切实际或无法进行的实验成为可能。事实上,越来越多的XFEL设施正在建设和规划中,其目标是提供更大的脉冲能量和更高的峰值亮度。在寻求提高脉冲功率时,至关重要的是要考虑掠入射FEL镜能够承受的最大脉冲注量。为了解决这个问题,在欧洲XFEL设施上对软X射线FEL脉冲的掠入射损伤进行了多项研究。使用1keV光子能量对抛光硅衬底上的碳化硼(BC)涂层进行了研究,这与目前安装在软X射线光束线(SASE3)上的X射线镜类似。本研究的目的是比较BC和Si的损伤阈值,以确定使用BC涂层的优势、耐受性和局限性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/34ae040ae3f7/s-31-01067-fig3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/4913df471336/s-31-01067-fig1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/bb5305f31f58/s-31-01067-fig2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/34ae040ae3f7/s-31-01067-fig3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/4913df471336/s-31-01067-fig1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/bb5305f31f58/s-31-01067-fig2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/604a/11371029/34ae040ae3f7/s-31-01067-fig3.jpg

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本文引用的文献

1
Damage thresholds for blaze diffraction gratings and grazing incidence optics at an X-ray free-electron laser.X射线自由电子激光下闪耀衍射光栅和掠入射光学元件的损伤阈值
J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):85-90. doi: 10.1107/S1600577517016083.
2
Damage threshold of coating materials on x-ray mirror for x-ray free electron laser.用于X射线自由电子激光的X射线镜涂层材料的损伤阈值
Rev Sci Instrum. 2016 May;87(5):051801. doi: 10.1063/1.4950723.
3
Spot size characterization of focused non-Gaussian X-ray laser beams.聚焦非高斯X射线激光束的光斑尺寸表征
Opt Express. 2010 Dec 20;18(26):27836-45. doi: 10.1364/OE.18.027836.
4
Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser.短X射线脉冲与直线加速器相干光源(LCLS)自由电子激光装置中低Z值X射线光学材料的相互作用
Opt Express. 2010 Nov 8;18(23):23933-8. doi: 10.1364/OE.18.023933.
5
Simple technique for measurements of pulsed Gaussian-beam spot sizes.测量脉冲高斯光束光斑尺寸的简单技术。
Opt Lett. 1982 May 1;7(5):196-8. doi: 10.1364/ol.7.000196.