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CsTeCl双钙钛矿中压力调制自陷激子发射的机制

Mechanism of Pressure-Modulated Self-Trapped Exciton Emission in CsTeCl Double Perovskite.

作者信息

Shi Han, Chen Lin, Moutaabbid Hicham, Feng Zhenbao, Zhang Guozhao, Wang Lingrui, Li Yinwei, Guo Haizhong, Liu Cailong

机构信息

School of Physics Science & Information Technology, Liaocheng University, Liaocheng, 252059, P. R. China.

CNRS, Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie (IMPMC), UMR CNRS 7590, Muséum National d'Histoire Naturelle, IRD UMR 206, Sorbonne Université, 4 place Jussieu, Paris, 75005, France.

出版信息

Small. 2024 Nov;20(48):e2405692. doi: 10.1002/smll.202405692. Epub 2024 Sep 2.

Abstract

Pressure-modulated self-trapped exciton (STE) emission mechanism in all-inorganic lead-free metal halide double perovskites characterized by large Stokes-shifted broadband emission, has attracted much attention across various fields such as optics, optoelectronics, and biomedical sciences. Here, by employing the all-inorganic lead-free metal halide double perovskite CsTeCl as a paradigm, the authors elucidate that the performance of STE emission can be modulated by pressure, attributable to the pressure-induced evolution of the electronic state (ES). Two ES transitions happen at pressures of 1.6 and 5.8 GPa, sequentially. The electronic behaviors of CsTeCl can be jointly modulated by both pressure and ES transitions. When the pressure reaches 1.6 GPa, the Huang-Rhys factor S, indicative of the strength of electron-phonon coupling, attains an optimum value of ≈12.0, correlating with the pressure-induced photoluminescence (PL) intensity of CsTeCl is 4.8-fold that of its PL intensity under ambient pressure. Through analyzing the pressure-dependent STE dynamic behavioral changes, the authors have revealed the microphysical mechanism underlying the pressure-modulated enhancement and quenching of STE emission in CsTeCl.

摘要

以具有大斯托克斯位移宽带发射为特征的全无机无铅金属卤化物双钙钛矿中的压力调制自陷激子(STE)发射机制,在光学、光电子学和生物医学科学等各个领域引起了广泛关注。在此,作者以全无机无铅金属卤化物双钙钛矿CsTeCl为例,阐明了STE发射性能可通过压力进行调制,这归因于压力诱导的电子态(ES)演化。两个ES跃迁依次发生在1.6和5.8 GPa的压力下。CsTeCl的电子行为可由压力和ES跃迁共同调制。当压力达到1.6 GPa时,表征电子 - 声子耦合强度的黄 - 里斯因子S达到约12.0的最佳值,这与压力诱导的CsTeCl光致发光(PL)强度是其在常压下PL强度的4.8倍相关。通过分析压力依赖的STE动态行为变化,作者揭示了CsTeCl中STE发射的压力调制增强和猝灭背后的微观物理机制。

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