Klimtová Markéta, Veselý Petr, Králová Iva, Dušek Karel
Department of Electrotechnology, Faculty of Electrical Engineering, Czech Technical University in Prague, Technická 2, 160 00 Prague, Czech Republic.
Materials (Basel). 2024 Aug 27;17(17):4242. doi: 10.3390/ma17174242.
Electrochemical migration (ECM) on the surface of printed circuit boards (PCBs) continues to pose a significant reliability risk in electronics. Nevertheless, the existing literature lacks studies that address the solder mask and solder pad design aspects in the context of ECM. Therefore, the objective of this study was to assess the impact of solder mask type with varying roughness and solder pad design on the susceptibility to ECM using a water drop test and thermal humidity bias test. Hot air solder leveling-coated PCBs were tested. Furthermore, the ECM tests were conducted on PCBs with applied no-clean solder paste to evaluate the influence of flux residues on the resulting ECM behavior. The results indicated that the higher roughness of the solder mask significantly contributes to ECM inhibition through the creation of a mechanical barrier for the dendrites. Furthermore, lower ECM susceptibility was also observed for copper-defined pads, where a similar effect is presumed. However, the influence of the no-clean flux residues can prevail over the effects of the solder mask. Therefore, the use of a rough solder mask and a copper-defined pad design is recommended if the PCB is to be washed from flux residues after the soldering process.
印刷电路板(PCB)表面的电化学迁移(ECM)仍然是电子设备中一个重大的可靠性风险。然而,现有文献缺乏在ECM背景下探讨阻焊层和焊盘设计方面的研究。因此,本研究的目的是通过水滴试验和热湿偏置试验,评估不同粗糙度的阻焊层类型和焊盘设计对ECM敏感性的影响。对热风整平涂覆的印刷电路板进行了测试。此外,对涂覆免清洗焊膏的印刷电路板进行了ECM测试,以评估助焊剂残留对所得ECM行为的影响。结果表明,阻焊层的较高粗糙度通过为枝晶形成机械屏障,显著有助于抑制ECM。此外,对于铜定义焊盘也观察到较低的ECM敏感性,推测有类似的效果。然而,免清洗助焊剂残留的影响可能超过阻焊层的影响。因此,如果在焊接过程后要从印刷电路板上清洗助焊剂残留,则建议使用粗糙的阻焊层和铜定义的焊盘设计。