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分析桃一年生枝条的抗寒性(基于差示热分析)。

Analyzing cold hardiness (Based on DTA) of one-year-old branches of peaches.

机构信息

Research Institute of Pomology of CAAS, Xingcheng, Liaoning, China.

Changli Fruit Institute, Hebei Academy of Agriculture and Forestry Sciences, Changli, Hebei, China.

出版信息

PLoS One. 2024 Sep 17;19(9):e0306914. doi: 10.1371/journal.pone.0306914. eCollection 2024.

Abstract

In this study, we conducted a low-temperature exothermic (LTE) investigation on 1-year-old (1a) branches of sixteen peach cultivars through a differential thermal analysis (DTA) procedure. We used a three-point approach to determine the lethal injury temperature (LT-I) of the xylem, the LTE correlation indexes, and the subordinate function value method were applied to compare cold hardiness of sixteen peach varieties. The results showed that the slope of the LT-I for the xylem of sixteen peach cultivars was different, and the LTE indexes were significantly different. Among all the studied varieties, the cold hardiness was strongest in Donghe No.1, followed by Wangjiazhuangmaotao No.2 and Hunchun. Qiuyan and Yanhong are second, and belong to the cold-resistant type; Qiuyi, Okubo, Zhongnongjinhui, and Chunmei, exhibited medium cold hardiness. Zhongtaohongyu, Spring snow, Yufei, and Zhongyou No.8 varieties exhibited low hardiness; while the 21st century, Golden Honey No. 1 and Zhonghuashoutao have the worst cold hardiness and are the weakest cold-hardiness types. In addition, the injury degrees of xylem from LT-I analysis were significantly related to the browning rates (BR) and electrolytic leakage (EI) from traditional low temperature freezing analysis. It is demonstrated that the LTE analysis is a simple, accurate, and practical method for identifying the cold hardiness of 1a branches of peach.

摘要

本研究通过差示热分析(DTA)程序对 16 个桃品种 1 年生枝条进行低温放热(LTE)研究。采用三点法确定木质部的致死温度(LT-I)、LTE 相关指标,并采用隶属函数值法对 16 个桃品种的抗寒性进行比较。结果表明,16 个桃品种木质部 LT-I 的斜率不同,LTE 指标差异显著。在所有供试品种中,冬荷 1 号的抗寒性最强,其次是王家寨毛桃 2 号和珲春,其次是秋艳和红艳,属于抗寒型;秋宜、大久保、中农金辉和春美属于中抗型;中桃红玉、春雪、玉妃和中油 8 号属于低抗型;21 世纪、金甜蜜 1 号和中化寿桃抗寒性最差,属于最弱的抗寒型。此外,LT-I 分析的木质部损伤程度与传统低温冷冻分析的褐变率(BR)和电导率(EI)显著相关。结果表明,LTE 分析是一种简单、准确、实用的桃 1 年生枝条抗寒性鉴定方法。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/34c0/11407669/e62a552eacb2/pone.0306914.g001.jpg

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