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通过四面体 DNA 纳米结构的扩展显微镜实现高亮且均匀的细胞超微结构可视化。

Visualizing highly bright and uniform cellular ultrastructure by expansion-microscopy with tetrahedral DNA nanostructures.

机构信息

Institute of Photonic Chips, University of Shanghai for Science and Technology, 516 Jungong Road, Shanghai 200093, China; Department of Optical Science and Engineering, Shanghai Engineering Research Center of Ultra-precision Optical Manufacturing, Key Laboratory of Micro and Nano Photonic Structures (Ministry of Education), Green Photoelectron Platform, Fudan University, 220 Handan Road, Shanghai 200433, China.

Shanghai Engineering Research Center of Industrial Microorganisms, The Multiscale Research Institute of Complex Systems (MRICS), School of Life Sciences, Fudan University, 220 Handan Road, Shanghai 200433, China.

出版信息

J Photochem Photobiol B. 2024 Nov;260:113034. doi: 10.1016/j.jphotobiol.2024.113034. Epub 2024 Sep 10.

Abstract

Expansion Microscopy (ExM) is a widely used super-resolution technique that enables imaging of structures beyond the diffraction limit of light. However, ExM suffers from weak labeling signals and expansion distortions, limiting its applicability. Here, we present an innovative approach called Tetrahedral DNA nanostructure Expansion Microscopy (TDN-ExM), addressing these limitations by using tetrahedral DNA nanostructures (TDNs) for fluorescence labeling. Our approach demonstrates a 3- to 10-fold signal amplification due to the multivertex nature of TDNs, allowing the modification of multiple dyes. Previous studies have confirmed minimal distortion on a large scale, and our strategy can reduce the distortion at the ultrastructural level in samples because it does not rely on anchoring agents and is not affected by digestion. This results in a brighter fluorescence, better uniformity, and compatibility with different labeling strategies and optical super-resolution technologies. We validated the utility of TDN-ExM by imaging various biological structures with improved resolutions and signal-to-noise ratios.

摘要

扩展显微镜(ExM)是一种广泛使用的超分辨率技术,能够对超出光的衍射极限的结构进行成像。然而,ExM 受到弱标记信号和扩展失真的限制,限制了其适用性。在这里,我们提出了一种创新的方法,称为四面体 DNA 纳米结构扩展显微镜(TDN-ExM),通过使用四面体 DNA 纳米结构(TDN)进行荧光标记来解决这些限制。我们的方法由于 TDN 的多顶点性质而实现了 3 到 10 倍的信号放大,允许对多个染料进行修饰。先前的研究已经证实了在大规模上的最小失真,并且我们的策略可以在样品的超微结构水平上减少失真,因为它不依赖于锚固剂,并且不受消化的影响。这导致了更亮的荧光、更好的均匀性以及与不同标记策略和光学超分辨率技术的兼容性。我们通过对各种生物结构进行成像,验证了 TDN-ExM 的实用性,这些结构的分辨率和信噪比得到了提高。

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