• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

(NH)S溶液处理p-GaN/金属化界面的利弊:激光二极管的视角

Pros and Cons of (NH)S Solution Treatment of p-GaN/Metallization Interface: Perspectives for Laser Diode.

作者信息

Levchenko Iryna, Kryvyi Serhii, Kamińska Eliana, Smalc-Koziorowska Julita, Grzanka Szymon, Kacperski Jacek, Nowak Grzegorz, Kret Sławomir, Marona Łucja, Perlin Piotr

机构信息

Institute of High Pressures Physics, Polish Academy of Science, 29/37 Sokołowska St., 01-142 Warsaw, Poland.

Institute of Physics, Polish Academy of Sciences, 32/46 Al. Lotników, 02-668 Warsaw, Poland.

出版信息

Materials (Basel). 2024 Sep 14;17(18):4520. doi: 10.3390/ma17184520.

DOI:10.3390/ma17184520
PMID:39336261
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11433334/
Abstract

The impact of wet treatment using an (NH)S-alcohol solution on the interface state of the p-GaN/Ni/Au/Pt contact system and laser diode processing was investigated. Sulfur wet cleaning resulted in reduced surface roughness and contact resistivity. The lowest specific contact resistance ( < 1 × 10 Ω·cm) was achieved with samples treated with an (NH)S-isopropanol solution, whereas the highest resistivity ( = 3.3 × 10 Ω·cm) and surface roughness ( = 16 nm) were observed in samples prepared by standard methods. Annealing the contact system in an N + O + HO atmosphere caused degradation through species inter-diffusion and metal-metal solid solution formation, irrespective of the preparation method. Standard prepared substrates developed a thin GaN-Au intermediate layer at the interface after heat treatment. Enhanced adhesion and the absence of GaN decomposition were observed in samples additionally cleaned with the (NH)S-solvent solution. Complete oxidation of nickel to NiO was observed in samples that underwent additional sulfur solution treatment. The intensity of metal species mixing and nickel oxidation was influenced by the metal diffusion rate and was affected by the initial state of the GaN substrate obtained through different wet treatment methods.

摘要

研究了使用(NH)S-醇溶液进行湿法处理对p-GaN/Ni/Au/Pt接触系统的界面态和激光二极管加工的影响。硫湿法清洗降低了表面粗糙度和接触电阻率。用(NH)S-异丙醇溶液处理的样品实现了最低的比接触电阻(<1×10Ω·cm),而通过标准方法制备的样品中观察到最高的电阻率(=3.3×10Ω·cm)和表面粗糙度(=16nm)。在N+O+HO气氛中对接触系统进行退火会因物种相互扩散和金属-金属固溶体形成而导致退化,与制备方法无关。标准制备的衬底在热处理后在界面处形成了一层薄的GaN-Au中间层。在用(NH)S-溶剂溶液额外清洗的样品中观察到附着力增强且没有GaN分解。在经过额外硫溶液处理的样品中观察到镍完全氧化为NiO。金属物种混合和镍氧化的强度受金属扩散速率影响,并受通过不同湿法处理方法获得的GaN衬底的初始状态影响。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/a02059ea416a/materials-17-04520-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/84e9531bf281/materials-17-04520-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/11c21e776163/materials-17-04520-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/bc4e92cdaee2/materials-17-04520-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/b70fc72fa9b1/materials-17-04520-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/23c614e84648/materials-17-04520-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/acf960cf8dda/materials-17-04520-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/bbe5a86dbf11/materials-17-04520-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/a02059ea416a/materials-17-04520-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/84e9531bf281/materials-17-04520-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/11c21e776163/materials-17-04520-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/bc4e92cdaee2/materials-17-04520-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/b70fc72fa9b1/materials-17-04520-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/23c614e84648/materials-17-04520-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/acf960cf8dda/materials-17-04520-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/bbe5a86dbf11/materials-17-04520-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fa01/11433334/a02059ea416a/materials-17-04520-g008.jpg

相似文献

1
Pros and Cons of (NH)S Solution Treatment of p-GaN/Metallization Interface: Perspectives for Laser Diode.(NH)S溶液处理p-GaN/金属化界面的利弊:激光二极管的视角
Materials (Basel). 2024 Sep 14;17(18):4520. doi: 10.3390/ma17184520.
2
Palladium-Based Contacts on p-GaN and Their Application in Laser Diodes.基于钯的p型氮化镓接触及其在激光二极管中的应用。
Materials (Basel). 2023 Oct 6;16(19):6568. doi: 10.3390/ma16196568.
3
Ohmic contacts to N-face p-GaN using Ni/Au for the fabrication of polarization inverted light-emitting diodes.使用Ni/Au制作极化反转发光二极管时与N面p型GaN的欧姆接触。
J Nanosci Nanotechnol. 2013 Aug;13(8):5715-8. doi: 10.1166/jnn.2013.7072.
4
Development of Low-Resistance Ohmic Contacts with Bilayer NiO/Al-Doped ZnO Thin Films to p-type GaN.具有双层 NiO/Al 掺杂 ZnO 薄膜的低电阻欧姆接触到 p 型 GaN 的开发。
ACS Appl Mater Interfaces. 2023 Feb 15;15(6):8723-8729. doi: 10.1021/acsami.2c21106. Epub 2023 Feb 2.
5
Interface and transport properties of metallization contacts to flat and wet-etching roughed N-polar n-type GaN.金属化接触到平整和湿法刻蚀粗糙 N 极性 n 型 GaN 的界面和传输特性。
ACS Appl Mater Interfaces. 2013 Jun 26;5(12):5797-803. doi: 10.1021/am401354z. Epub 2013 Jun 6.
6
Nano-scaled Pt/Ag/Ni/Au contacts on p-type GaN for low contact resistance and high reflectivity.用于低接触电阻和高反射率的p型氮化镓上的纳米级铂/银/镍/金触点。
J Nanosci Nanotechnol. 2011 Jul;11(7):6157-61. doi: 10.1166/jnn.2011.4351.
7
Formation of gallium vacancies and their effects on the nanostructure of Pd/Ir/Au ohmic contact to p-type GaN.
J Nanosci Nanotechnol. 2013 Dec;13(12):8106-9. doi: 10.1166/jnn.2013.8192.
8
Highly reflective Ag-Cu alloy-based ohmic contact on p-type GaN using Ru overlayer.
Opt Lett. 2008 Dec 15;33(24):2907-9. doi: 10.1364/ol.33.002907.
9
Impact of interlayer processing conditions on the performance of GaN light-emitting diode with specific NiOx/graphene electrode.层间处理条件对具有特定 NiOx/石墨烯电极的 GaN 发光二极管性能的影响。
ACS Appl Mater Interfaces. 2013 Feb;5(3):958-64. doi: 10.1021/am3026079. Epub 2013 Jan 23.
10
Interface observation in Au/Ni/p-GaN studied by HREM and energy-filtering TEM.通过高分辨电子显微镜(HREM)和能量过滤透射电子显微镜(EFTEM)对Au/Ni/p-GaN界面进行的观察。
J Electron Microsc (Tokyo). 2003;52(5):459-64. doi: 10.1093/jmicro/52.5.459.

引用本文的文献

1
Theoretical and Experimental Research on the Short-Range Structure in Gallium Melts Based on the Wulff Cluster Model.基于伍尔夫团簇模型的镓熔体短程结构的理论与实验研究
Materials (Basel). 2024 Dec 31;18(1):133. doi: 10.3390/ma18010133.

本文引用的文献

1
Palladium-Based Contacts on p-GaN and Their Application in Laser Diodes.基于钯的p型氮化镓接触及其在激光二极管中的应用。
Materials (Basel). 2023 Oct 6;16(19):6568. doi: 10.3390/ma16196568.
2
Effects of surface properties of GaN semiconductors on cell behavior.氮化镓半导体表面性质对细胞行为的影响。
Heliyon. 2023 Jul 11;9(7):e18150. doi: 10.1016/j.heliyon.2023.e18150. eCollection 2023 Jul.
3
Sulfur passivation of GaAs surfaces.
Phys Rev B Condens Matter. 1991 Sep 15;44(12):6306-6311. doi: 10.1103/physrevb.44.6306.