Lei Di, Xu Ying, Zou Xinhai, Zhang Yali, Zhang Zhiyao, Li Linze, Chen Baile, Zhang Shangjian, Liu Yong, Zhu Ninghua
Opt Lett. 2024 Oct 1;49(19):5439-5442. doi: 10.1364/OL.532291.
A novel, to the best of our knowledge, electro-optical modulation method is proposed for measuring third-order intermodulation distortion of photodetectors (PDs) based on de-coupling and de-embedding modulation distortion of modulators. The method utilizes dual parallel intensity modulation to generate electro-optical stimulus signals with fast and fine sweeping capability, and it eliminates the nonlinear impact of modulators by using low-frequency bias swing, allowing a direct extraction of the third-order output intercept point (OIP3) of PD from the combined nonlinear response contributed by both the modulators and the PD. The OIP3 of PD is frequency-swept measured with our method and compared to those with the conventional method to check for consistency. The proposed method enables a modulator-distortion-free, fast, and fine sweeping measurement of PDs using a simple system.
据我们所知,提出了一种新颖的电光调制方法,用于基于解耦和解嵌入调制器的调制失真来测量光电探测器(PD)的三阶互调失真。该方法利用双并行强度调制来生成具有快速和精细扫描能力的电光激励信号,并通过使用低频偏置摆动消除调制器的非线性影响,从而允许从调制器和PD共同产生的非线性响应中直接提取PD的三阶输出截点(OIP3)。使用我们的方法对PD的OIP3进行频率扫描测量,并与传统方法的测量结果进行比较以检查一致性。所提出的方法能够使用简单的系统对PD进行无调制器失真、快速且精细扫描的测量。