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铁电α-InSe/α-Te范德华异质结构中静电门控依赖的多能带对准

Electrostatic Gating-Dependent Multiple Band Alignments in Ferroelectric α-InSe/α-Te van der Waals Heterostructures.

作者信息

Ding Cheng, Zhu Yun-Lai, Qu Zihan, Dai Yuehua

机构信息

School of Electronic Information and Integrated Circuits, Hefei Normal University, Hefei 230601, PR China.

School of Integrated Circuits, Anhui University, Hefei 230601, PR China.

出版信息

Langmuir. 2024 Oct 15;40(41):21453-21459. doi: 10.1021/acs.langmuir.4c02225. Epub 2024 Oct 1.

Abstract

The two-dimensional ferroelectric van der Waals (vdW) heterojunction has been recognized as one of the most promising combinations for emerging ferroelectric memory materials due to its noncovalent bonding and flexible stacking of various materials. In this work, the first-principles calculations were performed to study the stable geometry and electronic structure of α-InSe/α-Te, incorporating the vdW correction via the DFT-D2 method. The reversal of the polarization direction in α-InSe can induce a transition in the heterostructure from metallic to semiconductor, accompanied by a shift from type-III to type-I band alignment. These changes are attributed to variations in interfacial charge transfer. Analysis of the modulation effects of external electric fields reveals that the P↑ α-InSe/α-Te configuration maintains metallic, whereas the P↓ α-InSe/α-Te configuration exhibits a linear reduction in band gap. Furthermore, both heterostructural configurations will undergo transitions to type-II band alignment transitions at 0.2 V Å and within a range from 0.2 to 0.3 V Å under external electric fields. Our findings offer valuable insights for applications such as ferroelectric memory and static gate devices with multiband alignment.

摘要

二维铁电范德华(vdW)异质结因其非共价键合以及各种材料的灵活堆叠,已被公认为是新兴铁电存储材料中最具潜力的组合之一。在这项工作中,通过DFT-D2方法纳入vdW校正,进行了第一性原理计算,以研究α-InSe/α-Te的稳定几何结构和电子结构。α-InSe中极化方向的反转可导致异质结构从金属态转变为半导体态,同时伴随着从III型能带排列转变为I型能带排列。这些变化归因于界面电荷转移的变化。对外部电场调制效应的分析表明,P↑ α-InSe/α-Te构型保持金属态,而P↓ α-InSe/α-Te构型的带隙呈线性减小。此外,在外部电场作用下,两种异质结构构型在0.2 V Å以及在0.2至0.3 V Å的范围内都会发生转变,变为II型能带排列。我们的研究结果为铁电存储器和具有多能带排列的静态栅极器件等应用提供了有价值的见解。

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