Carlson Max, Fitzgerald Ryan, Schmidt Dan, O'Neil Galen
NIST, Gaithersburg, MD, USA.
NIST, Boulder, CO, USA.
J Low Temp Phys. 2024;216(1-2). doi: 10.1007/s10909-024-03135-9.
By using a superconducting transition edge sensor (TES) to measure the thermal energy of individual decay events with high energy resolution, decay energy spectrometry provides a unique fingerprint to identify each radionuclide in a sample. The proposed measurement requires optimizing the thermal parameters of the detector for use with 5 MeV scale energy deposited by alpha decay of the sample radionuclides. The thermal performance of deep-etched silicon TES chips is examined with the use of an onboard resistive heater. With known heater power and bath temperature, the thermal conductance, heat capacity, and frame temperature are calculated and compared to theory.
通过使用超导转变边缘传感器（TES）以高能量分辨率测量单个衰变事件的热能，衰变能谱法提供了一种独特的指纹识别方式，用于鉴定样品中的每种放射性核素。所提出的测量需要优化探测器的热参数，以便与样品放射性核素的α衰变沉积的5 MeV量级能量配合使用。利用板载电阻加热器检查深度蚀刻硅TES芯片的热性能。在已知加热器功率和浴温的情况下，计算热导率、热容量和框架温度，并与理论值进行比较。
