Adamczyk Anna, Brylewski Tomasz, Szymczak Patryk
Faculty of Materials Science and Ceramics, AGH University of Kraków, Al. Mickiewicza 30, 30-059 Kraków, Poland.
Molecules. 2024 Sep 27;29(19):4592. doi: 10.3390/molecules29194592.
In this work, the structure of silica thin films synthesized with three different SiO precursors and obtained by the sol-gel method and dip coating technique was studied. Additionally, the influence of Ag addition on the obtained silica sols and then gel structure was investigated. Silica coatings show antireflective properties and high thermal resistance, as well as hydrophobic or hydrophilic properties. Three different silica precursors, TEOS (tetraethylorthosilicate), DDS (dimethyldietoxysilane) and Aerosil, were selected for the synthesis. DDS added to silica sol act as a pore size modifier, while Ag atoms are known for their antibacterial activity. Coatings were deposited on two different substrates: steel and titanium, dried and annealed at 500 °C in air (steel substrate) and in argon (titanium substrate). For all synthesized films, IR (infrared) spectroscopic studies were performed together with GID and XRD (Grazing Incidence Diffraction, X-ray Diffraction) measurements. The topography and morphology of the surface were traced by SEM and AFM microscopic methods, providing information on the samples' roughness, particle sizes and thickness of the particular layers. The wetting angle values were also measured. GID and XRD measurements pointed to the distinct contribution of an amorphous phase in the samples, allowing us to recognize the crystalline phases and calculate the silver crystallite sizes. The FTIR spectra gave information on the first coordination sphere of the studied samples.
在这项工作中，研究了通过溶胶 - 凝胶法和浸涂技术，用三种不同的SiO前驱体合成的二氧化硅薄膜的结构。此外，还研究了添加Ag对所得二氧化硅溶胶及其凝胶结构的影响。二氧化硅涂层具有抗反射性能、高耐热性以及疏水或亲水性能。选择了三种不同的二氧化硅前驱体：TEOS（正硅酸四乙酯）、DDS（二甲基二乙氧基硅烷）和气相二氧化硅用于合成。添加到二氧化硅溶胶中的DDS用作孔径调节剂，而Ag原子以其抗菌活性而闻名。涂层沉积在两种不同的基材上：钢和钛，干燥后在空气中（钢基材）和氩气中（钛基材）于500°C退火。对于所有合成薄膜，进行了红外（IR）光谱研究以及GID和XRD（掠入射衍射、X射线衍射）测量。通过SEM和AFM显微镜方法追踪表面的形貌和形态，提供有关样品粗糙度、颗粒尺寸和特定层厚度的信息。还测量了润湿角值。GID和XRD测量指出了样品中非晶相的明显贡献，使我们能够识别晶相并计算银微晶尺寸。FTIR光谱给出了所研究样品第一配位层的信息。
