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纳米管中的泰勒-阿里斯扩散:解析解、滑移和表面电势分布的影响以及滑移长度的测量

Taylor-Aris Dispersion in Nanotubes: Analytical Solution, Effects of Slip and Surface Potential Landscape, and Measurement of the Slip Length.

作者信息

Ebrahimi Fatemeh, Neek-Amal Mehdi, Sahimi Muhammad

机构信息

Department of Physics, The University of Birjand, Birjand 97175-615, Iran.

Department of Physics, Shahid Rajaee Teacher Training University, Lavizan, Tehran 16875-163, Iran.

出版信息

J Phys Chem B. 2024 Oct 31;128(43):10727-10734. doi: 10.1021/acs.jpcb.4c04221. Epub 2024 Oct 18.

Abstract

Taylor-Aris (T-A) dispersion of a solute in a flowing solvent is a fundamental phenomenon in most mass-transfer processes. Despite its significance and numerous applications in microreactors, colloidal transport in confined media, chromatographic separation, and transport in biological tissues, the effect of the slip length and the topology of surface potential landscapes on T-A dispersion in nanostructured channels has not been studied in detail. We propose a novel methodology for molecular dynamics (MD) simulation of T-A dispersion in such systems, derive an analytical expression for the dispersion coefficient in them, and report on the results of extensive MD simulations of the phenomenon in carbon nanotubes and hexagonal carbon nanochannels. By broadening the topology of the surface energy landscape, we vary the slip lengths, making it possible to distinguish between the effects of confinement, the topology of the energy landscape, and the slip length on the T-A dispersion coefficient. It is demonstrated that measuring the T-A dispersion coefficient in laminar flow is a straightforward and reliable approach for estimating the slip length in nanotubes and other nanostructured materials.

摘要

溶质在流动溶剂中的泰勒-阿里斯(T-A)分散是大多数传质过程中的一种基本现象。尽管它在微反应器、受限介质中的胶体传输、色谱分离以及生物组织中的传输等方面具有重要意义和众多应用,但纳米结构通道中滑移长度和表面势景观拓扑对T-A分散的影响尚未得到详细研究。我们提出了一种用于此类系统中T-A分散分子动力学(MD)模拟的新方法,推导了其中分散系数的解析表达式,并报告了在碳纳米管和六边形碳纳米通道中对该现象进行广泛MD模拟的结果。通过拓宽表面能景观的拓扑结构,我们改变了滑移长度,从而能够区分限制效应、能量景观拓扑以及滑移长度对T-A分散系数的影响。结果表明,测量层流中的T-A分散系数是估计纳米管和其他纳米结构材料中滑移长度的一种直接且可靠的方法。

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