Hogan Conor, Sette Andrea, Saroka Vasil A, Colonna Stefano, Flammini Roberto, Florean Laurita, Bernard Romain, Masson Laurence, Prévot Geoffroy, Ronci Fabio
CNR-Istituto di Struttura della Materia (CNR-ISM), Rome, Italy.
Dipartimento di Fisica, Università di Roma "Tor Vergata", Rome, Italy.
Nat Commun. 2024 Oct 25;15(1):9242. doi: 10.1038/s41467-024-53589-4.
Silicon surface alloys and silicide nanolayers are highly important as contact materials in integrated circuit devices. Here we demonstrate that the submonolayer Si/Ag(001) surface reconstruction, reported to exhibit interesting topological properties, comprises a quasi-one-dimensional Si-Ag surface alloy based on chains of planar double-pentagon Si moieties. This geometry is determined using a combination of density functional theory calculations, scanning tunnelling microscopy, and grazing incidence x-ray diffraction simulations, and yields an electronic structure in excellent agreement with photoemission measurements. This work provides further evidence of pentagonal geometries in 2D materials and heterostructures and elucidates the importance of surface alloying in stabilizing their formation.
硅表面合金和硅化物纳米层作为集成电路器件中的接触材料非常重要。在此我们证明,据报道具有有趣拓扑性质的亚单层Si/Ag(001)表面重构包含一种基于平面双五角形Si部分链的准一维Si-Ag表面合金。这种几何结构是通过结合密度泛函理论计算、扫描隧道显微镜和掠入射X射线衍射模拟确定的,其产生的电子结构与光电子能谱测量结果高度吻合。这项工作为二维材料和异质结构中的五角形几何结构提供了进一步证据,并阐明了表面合金化在稳定其形成过程中的重要性。