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称重传感器的温度场分析与补偿改进

Temperature field analysis and compensation improvement of load cell.

作者信息

Zhuang Shudong, Yang Wen, Zhou Yuxiang, Zou Ying, Liu Chang, Zhang Le, Tong Miao, Ma Jinlong

机构信息

College of Mechanical and Electrical Engineering, Hohai University, 213022, Changzhou, China.

Department of Physics, California San Diego University, San Diego, CA, 92127, USA.

出版信息

Sci Rep. 2024 Oct 31;14(1):26213. doi: 10.1038/s41598-024-76688-0.

DOI:10.1038/s41598-024-76688-0
PMID:39482364
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11527985/
Abstract

During the operation of load cell, heat is generated by the strain gauge and the electronics on the PCB board, which leads to temperature gradients within the sensor itself. These temperature gradients are unstable at different ambient temperatures. Compensation inaccuracies can also occur when compensating for sensor measurements at different temperatures This paper proposes a method to change the position of temperature compensation resistors to address errors caused by the temperature field effect of the strain gauge sensor itself. Without affecting the sensor's strain measurement, the correctness of the proposed method is demonstrated through steady-state thermal simulation results in ANSYS and experimental results, effectively addressing errors caused by unstable temperature gradients during the operation of strain gauge sensors.

摘要

在称重传感器运行期间,应变片和印刷电路板上的电子元件会产生热量,这会导致传感器内部出现温度梯度。这些温度梯度在不同的环境温度下不稳定。在对不同温度下的传感器测量进行补偿时,也会出现补偿不准确的情况。本文提出一种改变温度补偿电阻位置的方法,以解决应变片传感器自身温度场效应引起的误差。在不影响传感器应变测量的情况下,通过ANSYS中的稳态热模拟结果和实验结果证明了该方法的正确性,有效解决了应变片传感器运行期间温度梯度不稳定引起的误差。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/e02b101e4519/41598_2024_76688_Fig11_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/d39cfcd1e46c/41598_2024_76688_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/2bb836713263/41598_2024_76688_Fig2_HTML.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/dcacbc8efe9e/41598_2024_76688_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/f97831adc451/41598_2024_76688_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/66d0397d0ea2/41598_2024_76688_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/f6d2d212e635/41598_2024_76688_Fig7_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/95c3a5a253d6/41598_2024_76688_Fig8_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/e0a2e2734cfe/41598_2024_76688_Fig9_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/811a57afe184/41598_2024_76688_Fig10_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/e02b101e4519/41598_2024_76688_Fig11_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/d39cfcd1e46c/41598_2024_76688_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/2bb836713263/41598_2024_76688_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/acdde937f847/41598_2024_76688_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/dcacbc8efe9e/41598_2024_76688_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/f97831adc451/41598_2024_76688_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/66d0397d0ea2/41598_2024_76688_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/f6d2d212e635/41598_2024_76688_Fig7_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/95c3a5a253d6/41598_2024_76688_Fig8_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/e0a2e2734cfe/41598_2024_76688_Fig9_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/811a57afe184/41598_2024_76688_Fig10_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6229/11527985/e02b101e4519/41598_2024_76688_Fig11_HTML.jpg

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