Chen Sixin, Xu Meng, Song Zhaolin, Shi Yiran, Bai Ruichen, Jie Wanqi, Zhu Menghua
State Key Laboratory of Solidification Processing, Key Laboratory of Radiation Detection Materials and Devices, and School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, China.
ACS Appl Mater Interfaces. 2025 Jan 8;17(1):1635-1643. doi: 10.1021/acsami.4c18212. Epub 2024 Dec 18.
Inorganic halide perovskite thin-film X-ray detectors have attracted great research interest in recent years due to their high sensitivity, low detection limit, and facile fabrication process. The poor crystal quality of the thin film with uncontrollable thickness and low background voltage during detection limits its practical application. Here, a high-quality CsPbBrI ( = 0, 1) columnar crystal film is prepared by an improved melt-confined method with a porous anodic aluminum oxide (AAO) template, which stabilizes the disorder perovskite systems of CsPbBrI by stress. The AAO-CsPbBrI ( = 0) detectors exhibit high detection accuracy and photoelectric conversion capability with an ultrahigh sensitivity of 32,399.5 μC·Gy·cm at 2142.9 V mm under 20 kV X-rays and 19,217.4 μC·Gy·cm with a higher background electric field of 6666.7 V mm for AAO-CsPbBrI ( = 1). Moreover, the AAO-CsPbBrI ( = 1) film detector acquires a lower detection limit of 7.65 nGy·s and a higher X-ray imaging spatial resolution of 1.6 LP/mm and 8.6 nGy·s and 1.4 LP/mm for AAO-CsPbBrI ( = 0). The facile, high-quality columnar crystal film devices display great potential for low-energy and low-dose X-ray imaging in flat panel detection applications.
近年来，无机卤化物钙钛矿薄膜X射线探测器因其高灵敏度、低检测限和简便的制造工艺而引起了极大的研究兴趣。薄膜晶体质量差、厚度不可控以及检测过程中背景电压低限制了其实际应用。在此，通过一种改进的熔体限制法，利用多孔阳极氧化铝（AAO）模板制备了高质量的CsPbBrI（ = 0, 1）柱状晶体薄膜，该模板通过应力稳定了CsPbBrI的无序钙钛矿体系。AAO-CsPbBrI（ = 0）探测器在20 kV X射线下，于2142.9 V/mm时具有32399.5 μC·Gy·cm的超高灵敏度，以及在6666.7 V/mm的更高背景电场下，对于AAO-CsPbBrI（ = 1）具有19217.4 μC·Gy·cm的高检测精度和光电转换能力。此外，AAO-CsPbBrI（ = 1）薄膜探测器的检测限低至7.65 nGy·s，对于AAO-CsPbBrI（ = 0）具有1.6 LP/mm的更高X射线成像空间分辨率以及8.6 nGy·s和1.4 LP/mm。这种简便的高质量柱状晶体薄膜器件在平板检测应用中的低能和低剂量X射线成像方面显示出巨大潜力。
