Kallel Rahma, Hammami Rania, Dammak Aiman, Safi Faiza, Akrout Malek, Abid Leila, Kammoun Samir, Jihen Jedidi
Service de Cardiologie, Centre Hospitalier Universitaire Hedi Chaker de Sfax, Sfax, Tunisie.
Service de Chirurgie Cardiovasculaire, Centre Hospitalier Universitaire Habib Bourguiba, Sfax, Tunisie.
Pan Afr Med J. 2024 Sep 30;49:24. doi: 10.11604/pamj.2024.49.24.25891. eCollection 2024.
The benefits of permanent cardiac pacing have been widely demonstrated. However, the literature on complications remains inconsistent. We lack precise information about the frequency of complications and their predictive factors in our center. The purpose of this study was to determine the frequency of complications related to permanent cardiac pacing in our centre and to specify their predictive factors. We conducted a retrospective, observational, descriptive and analytical study. It involved patients who underwent an implantable electronic device (CIED) procedure, such as a pacemaker (PM) or implantable cardioverter-defibrillator (ICD) at the University Hospital Center of Sfax, Tunisia between January 2009 and December 2013. All clinical and paraclinical characteristics of the patients, their procedural data and any potential complications related to CIED implantation were collected (infectious complications, pocket hematomas, lead-related complications, vascular access complications, and complication-related mortality). Appropriate statistical tests were used to analyze the incidence of complications and their associated factors through multivariate analysis and to perform a survival analysis. We collected data from 462 procedures, including 420 PMs and 42 ICDs. The population had an average age of 72 ± 15 years. Hypertension was present in 55.1% of cases, diabetes in 22.3%, and 63.38% had underlying heart disease. A total of 64 complications were noted, accounting for 11.5% of the procedures. Complications were significantly more frequent with ICDs than PMs (23.8% vs. 10.2%; p=0.04). The incidence of infectious complications was 1.96%. Associated risk factors included diabetes (adjusted OR: 4.35, 95% CI 1.08-17.48; p=0.038) and reduced left ventricular ejection fraction (adjusted OR: 9.2, 95% CI 1.83-46.12; p=0.007). The incidence of pocket hematomas was 1.53%, with its associated risk factor being an indication for therapeutic anticoagulation (adjusted OR: 29.05, 95% CI 3.42-246.57; p=0.002). Lead-related complications were the most common (73.4% of complications). Their independent predictive factor was the number of manipulations greater than one (adjusted OR: 3.66, 95% CI 0.98-13.61; p=0.05). Among this subgroup, lead displacement was the most frequent (40.05%), with the presence of hypertensive heart disease as an associated risk factor (adjusted OR: 3.99, 95% CI 1.2-13.1; p=0.019). Vascular access complications were rare, occurring in 0.21% of cases. Mortality related to complications of cardiac device implantation was high (13.2%), particularly in the case of infectious complications (p=0.04). Overall survival at 5 years was 84.5%. The incidence of IEDC-related complications in the short and long term at our center was high, with a significant associated mortality, although comparable to the literature data. By identifying associated risk factors such as diabetes, heart failure, therapeutic anticoagulation, and repeat surgeries, we can adopt an informed therapeutic approach to reduce complications.
永久性心脏起搏的益处已得到广泛证实。然而,关于并发症的文献仍不一致。我们中心缺乏有关并发症发生率及其预测因素的精确信息。本研究的目的是确定我们中心与永久性心脏起搏相关的并发症发生率,并明确其预测因素。我们进行了一项回顾性、观察性、描述性和分析性研究。研究对象为2009年1月至2013年12月在突尼斯斯法克斯大学医院中心接受植入式电子设备(CIED)手术的患者,如起搏器(PM)或植入式心律转复除颤器(ICD)。收集了患者的所有临床和辅助检查特征、手术数据以及与CIED植入相关的任何潜在并发症(感染性并发症、囊袋血肿、导线相关并发症、血管通路并发症以及与并发症相关的死亡率)。使用适当的统计检验通过多变量分析来分析并发症的发生率及其相关因素,并进行生存分析。我们收集了462例手术的数据,包括420例起搏器植入和42例植入式心律转复除颤器植入。研究人群的平均年龄为72±15岁。55.1%的病例患有高血压,22.3%患有糖尿病,63.38%患有基础心脏病。共记录到64例并发症,占手术的11.5%。与植入式心律转复除颤器相关的并发症明显比起搏器更常见(23.8%对10.2%;p=0.04)。感染性并发症的发生率为1.96%。相关危险因素包括糖尿病(校正比值比:4.35,95%可信区间1.08 - 17.48;p=0.038)和左心室射血分数降低(校正比值比:9.2,95%可信区间1.83 - 46.12;p=0.007)。囊袋血肿的发生率为1.53%,其相关危险因素是治疗性抗凝指征(校正比值比:29.05,95%可信区间3.42 - 246.57;p=0.002)。导线相关并发症最为常见(占并发症的73.4%)。其独立预测因素是操作次数大于一次(校正比值比:3.66,95%可信区间0.98 - 13.61;p=0.05)。在这个亚组中,导线移位最为常见(40.05%),高血压性心脏病的存在是相关危险因素(校正比值比:3.99,95%可信区间1.2 - 13.1;p=0.019)。血管通路并发症很少见,发生率为0.21%。与心脏设备植入并发症相关的死亡率很高(13.2%),尤其是在感染性并发症的情况下(p=0.04)。5年总生存率为84.5%。我们中心短期和长期与植入式电子设备相关并发症的发生率很高,伴有显著的相关死亡率,尽管与文献数据相当。通过识别糖尿病、心力衰竭、治疗性抗凝和重复手术等相关危险因素,我们可以采取明智的治疗方法来减少并发症。