Park Yujin, Kim Joohoon, Yang Younghwan, Oh Dong Kyo, Kang Hyunjung, Kim Hongyoon, Rho Junsuk
Department of Mechanical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, Republic of Korea.
Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang, 37673, Republic of Korea.
Adv Sci (Weinh). 2025 Mar;12(10):e2409371. doi: 10.1002/advs.202409371. Epub 2025 Jan 7.
The commercialization of metasurfaces is crucial for real-world applications such as wearable sensors, pigment-free color pixels, and augmented and virtual reality devices. Nanoparticle-embedded resin-based nanoimprint lithography (PER-NIL) has shown itself to be a low-cost, high-throughput manufacturing method enabling the replication of high-index nanostructures. It has been extensively integrated into the fabrication of hologram metasurfaces, metalenses, and sensors due to its procedural simplicity. Most research on PER-NIL has been limited to exploring appropriate materials to enhance the efficiency of imprinted metasurfaces, but the intrinsic issue of PER-NIL lies in the high-index residual layer remaining on the substrate. This high-index residual layer generates undesired noise, limiting the efficiency and functionality of imprinted metasurfaces. Despite the need for the removal of the residual layer, it has never been experimentally achieved owing to the different etching rates between the nanoparticles and resin. Here, a new methodology named tape-assisted PER-NIL is proposed, achieving one-step removal of the residual layer using a tape. This novel method enables the replication of residual layer-free, high-index metasurfaces. As a result, imprinted residual layer-free metasurfaces prove their potential in high-purity dielectric structural colorations by achieving a sharp reflectance peak unattainable with conventional NIL, and in vivid hologram metasurfaces by covering a full 2π phase without unwanted scattering.
超表面的商业化对于可穿戴传感器、无色素彩色像素以及增强现实和虚拟现实设备等实际应用至关重要。基于纳米颗粒嵌入树脂的纳米压印光刻技术(PER-NIL)已证明自身是一种低成本、高通量的制造方法,能够复制高折射率纳米结构。由于其工艺简单,它已被广泛应用于全息超表面、超透镜和传感器的制造中。大多数关于PER-NIL的研究都局限于探索合适的材料以提高压印超表面的效率,但PER-NIL的固有问题在于基板上会残留高折射率层。这种高折射率残留层会产生不期望的噪声,限制了压印超表面的效率和功能。尽管需要去除残留层,但由于纳米颗粒和树脂之间蚀刻速率不同,一直未能通过实验实现。在此,提出了一种名为胶带辅助PER-NIL的新方法,利用胶带一步去除残留层。这种新方法能够复制无残留层的高折射率超表面。结果,压印的无残留层超表面通过实现传统纳米压印无法达到的尖锐反射峰,证明了其在高纯度介电结构着色方面的潜力;并且通过覆盖完整的2π相位且无有害散射,在生动的全息超表面方面也展现出潜力。