Simpson Jamie, Yoder Mason, Christian-Miller Nathaniel, Wheat Heather, Kovacs Boldizsar, Cunnane Ryan, Ghannam Michael, Liang Jackson J
Department of Internal Medicine, University of Michigan, Ann Arbor, MI 48109, USA.
Department of Clinical Electrophysiology, Frankel Cardiovascular Center, University of Michigan, Ann Arbor, MI 48109, USA.
J Clin Med. 2025 Mar 18;14(6):2058. doi: 10.3390/jcm14062058.
Cardiac implantable electronic devices (CIEDs) are commonly used for a number of cardiac-related conditions, and it is estimated that over 300,000 CIEDs are placed annually in the US. With advances in technology surrounding these devices and expanding indications, CIEDs can remain implanted in patients for long periods of time. Although the safety profile of these devices has improved over time, both the incidence and prevalence of long-term complications are expected to increase. This review highlights pertinent long-term complications of CIEDs, including lead-related issues, device-related arrhythmias, inappropriate device therapies, and device-related infections. We also explore key clinical aspects of each complication, including common presentations, patient-specific and non-modifiable risk factors, diagnostic evaluation, and recommended management strategies. Our goal is to help spread awareness of CIED-related complications and to empower physicians to manage them effectively.
心脏植入式电子设备(CIEDs)常用于多种与心脏相关的病症,据估计,美国每年植入超过30万件CIEDs。随着围绕这些设备的技术进步和适应症的扩大,CIEDs可在患者体内长期植入。尽管这些设备的安全性随着时间推移有所改善,但长期并发症的发生率和患病率预计都会增加。本综述重点介绍了CIEDs相关的长期并发症,包括导线相关问题、设备相关心律失常、不适当的设备治疗以及设备相关感染。我们还探讨了每种并发症的关键临床方面,包括常见表现、患者特异性和不可改变的风险因素、诊断评估以及推荐的管理策略。我们的目标是帮助提高对CIEDs相关并发症的认识,并使医生能够有效地管理这些并发症。