Characterization of Aligned Polymers Using the Spin Hall Effect of Light.

In this paper, we propose a scheme based on the spin Hall effect of light (SHEL) for characterizing aligned polymers. Poly (3-hexylthiophene) (P3HT) films were prepared via the solution shear coating method. The experimental results obtained by using SHEL indicated that the alignment of polymer chains could be enhanced by UV irradiation and was positively correlated with the irradiation time, which was consistent with the measurements of the UV-Vis spectrometer and the polarizing optical microscope (POM). Compared with other optical methods, such as POM that characterizes aligned samples using light intensity, the amplified shift in SHEL can significantly reduce technical noise and exhibit high sensitivity. Even for the weak alignment film, this method can still recognize its alignment and achieve a signal-to-noise ratio (SNR) of 30 dB. This renders SHEL a highly precise technique for studying aligned polymers, which is valuable for the development of organic electronics.