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带环植入导线中尖端加热的建模与测量

Modeling and measurement of lead tip heating in implanted wires with loops.

作者信息

Bardwell Speltz Lydia J, Lee Seung-Kyun, Shu Yunhong, Bernstein Matt A

机构信息

Department of Radiology, Mayo Clinic, Rochester, MN, United States of America.

GE HealthCare Technology & Innovation Center, Niskayuna, NY, United States of America.

出版信息

Phys Med Biol. 2025 Apr 22;70(9):095002. doi: 10.1088/1361-6560/adcc73.

Abstract

. In MRI, conductive lead tip heating caused by radiofrequency (RF) power deposition is an important safety issue for patients with implanted devices. In this work, we investigate lead tip heating in different wire configurations that contain loop(s) through theoretical models and experimental measurements.We have previously proposed analytical transfer function models to predict relative heating of implanted, straight metallic leads. Here we extend the models' application to leads containing loops, that are widely used in the clinic. Maximum temperature rise caused by RF heating was measured at 1.5 T on twenty (20) insulated, capped wires with various loop and straight segment configurations. The experimental results were compared with predictions from the previously reported simple exponential and adapted transmission line models, as well as with a long-wavelength approximation.Both models effectively predicted the trends in lead tip temperature rise for all the wire configurations, with the adapted transmission line model showing superior accuracy. In a typical MRI configuration where the RF electric field is predominantly in the superior/inferior (S/I) direction, wires oriented in the same direction showed decreased heating as the number of loops increased. However, when wires were oriented right/left (R/L) where the corresponding component of the electric field is negligible, additional loops increased the overall heating.The simple exponential and the adapted transmission line models previously developed for, and tested on, straight wires require no additional terms or further modification to account for RF heating in a variety of loop configurations. These results extend the models' usefulness to manage implanted device lead tip heating and provide theoretical insight regarding the role of loops and electrical lengths in managing RF safety of implanted devices.

摘要

在磁共振成像(MRI)中,射频(RF)功率沉积导致的导电导线尖端发热是植入式设备患者的一个重要安全问题。在这项工作中,我们通过理论模型和实验测量研究了包含环的不同导线配置中的导线尖端发热情况。我们之前提出了分析传递函数模型来预测植入的直金属导线的相对发热情况。在此,我们将这些模型的应用扩展到临床广泛使用的含环导线。在1.5T磁场下,对二十(20)根具有各种环和直线段配置的绝缘、带帽导线测量了由射频加热引起的最大温度升高。将实验结果与先前报道的简单指数模型和改进传输线模型的预测结果以及长波长近似结果进行了比较。两种模型都有效地预测了所有导线配置下导线尖端温度升高的趋势,其中改进传输线模型显示出更高的准确性。在典型的MRI配置中,射频电场主要沿上下(S/I)方向时,沿相同方向排列的导线随着环数量增加发热减少。然而,当导线沿左右(R/L)方向排列,此时电场相应分量可忽略不计时,额外的环会增加整体发热。先前为直导线开发并测试的简单指数模型和改进传输线模型无需额外项或进一步修改就能考虑各种环配置下的射频发热情况。这些结果扩展了模型在管理植入式设备导线尖端发热方面的实用性,并为环和电长度在管理植入式设备射频安全中的作用提供了理论见解。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7af0/12012431/159e6c035849/pmbadcc73f1_hr.jpg

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