Takamoto Masaya, Toyama Satoko, Seki Takehito, Futazuka Toshihiro, Findlay Scott D, Ikuhara Yuichi, Shibata Naoya
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan.
Murata Manufacturing Co. Ltd., Shiga 520-2393, Japan.
Sci Adv. 2025 Jun 13;11(24):eadu8021. doi: 10.1126/sciadv.adu8021.
Unique electrical properties emerging at nanoscale ferroelectric interfaces originate from the polarization induced charges. However, real-space characterization of polarization induced charges at nanoscale ferroelectric interfaces has been extremely challenging. Here, directly observing the nanoscale electric field by tilt-scan averaged differential phase contrast scanning transmission electron microscopy enables us to measure the spatially varying total charge density profiles across both head-to-head and tail-to-tail domain walls in a ferroelectric crystal. Combined with atomic column displacement measurements, the spatial distribution of polarization bound charges and screening charges across the domain walls can be disentangled. Our results reveal the true charge states of the nanoscale ferroelectric interfaces, providing an opportunity for experimentally exploring the interplay between atomic-scale local polarization structures and their charge states in ferroelectric interfaces.
纳米级铁电界面出现的独特电学性质源于极化诱导电荷。然而,对纳米级铁电界面处极化诱导电荷进行实空间表征极具挑战性。在此,通过倾斜扫描平均差分相衬扫描透射电子显微镜直接观察纳米级电场,使我们能够测量铁电晶体中头对头和尾对尾畴壁上空间变化的总电荷密度分布。结合原子列位移测量,可以分辨出畴壁上极化束缚电荷和屏蔽电荷的空间分布。我们的结果揭示了纳米级铁电界面的真实电荷状态,为实验探索铁电界面中原子尺度局部极化结构与其电荷状态之间的相互作用提供了机会。