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用于 Belle II 实验传播时间探测器的硅光电倍增管的发展

SiPM Developments for the Time-Of-Propagation Detector of the Belle II Experiment.

作者信息

Dal Corso Flavio, Kandra Jakub, Stroili Roberto, Torassa Ezio

机构信息

INFN Sezione di Padova, I-35131 Padova, Italy.

Dipartimento di Fisica e Astronomia, Università degli Studi di Padova, I-35131 Padova, Italy.

出版信息

Sensors (Basel). 2025 Jun 27;25(13):4018. doi: 10.3390/s25134018.

Abstract

Belle II is a particle physics experiment working at an high luminosity collider within a hard irradiation environment. The Time-Of-Propagation detector, aimed at the charged particle identification, surrounds the Belle II tracking detector on the barrel part. This detector is composed by 16 modules, each module contains a finely fused silica bar, coupled to microchannel plate photomultiplier tube (MCP-PMT) photo-detectors and readout by high-speed electronics. The MCP-PMT lifetime at the nominal collider luminosity is about one year, this is due to the high photon background degrading the quantum efficiency of the photocathode. An alternative to these MCP-PMTs is multi-pixel photon counters (MPPC), known as silicon photomultipliers (SiPM). The SiPMs, in comparison to MCP-PMTs, have a lower cost, higher photon detection efficiency and are unaffected by the presence of a magnetic field, but also have a higher dark count rate that rapidly increases with the integrated neutron flux. The dark count rate can be mitigated by annealing the damaged devices and/or operating them at low temperatures. We tested SiPMs, with different dimensions and pixel sizes from different producers, to study their time resolution (the main constraint that has to satisfy the photon detector) and to understand their behavior and tolerance to radiation. For these studies we irradiated the devices to radiation up to 5×10111 MeV neutrons equivalent (neq) per cm fluences; we also started studying the effect of annealing on dark count rates. We performed several measurements on these devices, on top of the dark count rate, at different conditions in terms of overvoltage and temperatures. These measurements are: IV-curves, amplitude spectra, time resolution. For the last two measurements we illuminated the devices with a picosecond pulsed laser at very low intensities (with a number of detected photons up to about twenty). We present results mainly on two types of SiPMs. A new SiPM prototype developed in collaboration with FBK with the aim of improving radiation hardness, is expected to be delivered in September 2025.

摘要

Belle II是一个在高亮度对撞机的强辐射环境中运行的粒子物理实验。用于带电粒子识别的飞行时间探测器环绕在Belle II桶部跟踪探测器周围。该探测器由16个模块组成,每个模块包含一根精细熔合的石英棒,与微通道板光电倍增管(MCP-PMT)光电探测器耦合,并由高速电子设备读出。在对撞机标称亮度下,MCP-PMT的寿命约为一年,这是由于高光子本底降低了光阴极的量子效率。这些MCP-PMT的一种替代方案是多像素光子计数器(MPPC),即硅光电倍增管(SiPM)。与MCP-PMT相比,SiPM成本更低、光子探测效率更高且不受磁场影响,但暗计数率也更高,且会随着积分中子通量迅速增加。通过对受损器件进行退火处理和/或在低温下运行,可以降低暗计数率。我们测试了来自不同生产商、具有不同尺寸和像素大小的SiPM,以研究它们的时间分辨率(这是光子探测器必须满足的主要限制条件),并了解它们的行为和对辐射的耐受性。为了这些研究,我们将器件辐照至高达5×10¹¹¹ MeV中子等效(neq)每平方厘米通量的辐射;我们还开始研究退火对暗计数率的影响。除了暗计数率,我们还在不同的过电压和温度条件下对这些器件进行了多项测量。这些测量包括:电流-电压曲线、幅度谱、时间分辨率。对于最后两项测量,我们用皮秒脉冲激光以非常低的强度照射器件(检测到的光子数最多约为二十个)。我们主要展示了两种类型SiPM的结果。与FBK合作开发的旨在提高辐射硬度的新型SiPM原型预计将于2025年9月交付。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e85c/12252385/fd3df8b5edfa/sensors-25-04018-g001.jpg

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