Hodecker Manuel, Dreuw Andreas, Dempwolff Adrian L
Interdisciplinary Center for Scientific Computing, Heidelberg University, Im Neuenheimer Feld 205, 69120 Heidelberg, Germany.
Division of Theoretical Chemistry and Biology, KTH Royal Institute of Technology, 100 44 Stockholm, Sweden.
Phys Chem Chem Phys. 2025 Aug 7;27(31):16418-16427. doi: 10.1039/d5cp01274k.
A scheme for the calculation of electron-attachment (EA) processes within the framework of unitary coupled-cluster (UCC) theory is presented. Analogous to the description of electron-detachment, the intermediate state representation (ISR) approach is used for the formulation and its relation to the algebraic-diagrammatic construction scheme is pointed out. Due to the UCC ansatz, the resulting equations cannot be given by closed-form expressions, but need to be approximated. Explicit working equations for two computational schemes referred to as EA-UCC2 and EA-UCC3 are given, providing electron-attachment energies and spectroscopic amplitudes of electron-attached states dominated by one-particle excitations correct through second and third order in perturbation theory, respectively. In the derivation, an expansion of the UCC transformed Hamiltonian involving Bernoulli numbers as expansion coefficients is employed. In a benchmark against full configuration interaction (FCI) results including 50 states of 21 different species, both neutral and charged, closed- and open-shell, the novel methods are characterized by mean absolute errors of 0.15 eV (EA-UCC2) and 0.10 eV (EA-UCC3). Furthermore, an approach for the computation of physical properties of electron-attached as well as electron-detached states within the UCC framework is presented. It also builds upon the ISR approach, featuring an expectation value-like formulation similar to that of the equation-of-motion coupled-cluster (EOM-CC) method or the ISR approach of the algebraic-diagrammatic construction (ADC) method. Explicit expressions for the expectation value of a general one-particle operator correct through second order in perturbation theory are given and shown to be equivalent to those of the second-order ADC/ISR procedure.
提出了一种在幺正耦合簇(UCC)理论框架内计算电子附着(EA)过程的方案。类似于电子脱离的描述,采用中间态表示(ISR)方法进行公式化,并指出了其与代数图示构建方案的关系。由于UCC假设,所得方程无法用封闭形式的表达式给出,而是需要进行近似。给出了称为EA-UCC2和EA-UCC3的两种计算方案的显式工作方程,分别提供了微扰理论中二阶和三阶主导单粒子激发的电子附着态的电子附着能和光谱振幅。在推导过程中,采用了以伯努利数作为展开系数的UCC变换哈密顿量的展开式。在与包括21种不同物种(中性和带电、闭壳层和开壳层)的50个态的完全组态相互作用(FCI)结果的基准测试中,新方法的平均绝对误差分别为0.15 eV(EA-UCC2)和0.10 eV(EA-UCC3)。此外,还提出了一种在UCC框架内计算电子附着态和电子脱离态物理性质的方法。它也基于ISR方法,具有类似于运动方程耦合簇(EOM-CC)方法或代数图示构建(ADC)方法的ISR方法的类似期望值的公式化。给出了微扰理论中二阶精确的一般单粒子算符期望值的显式表达式,并证明其与二阶ADC/ISR程序的表达式等价。