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具有ZrTe势垒的范德华CrSBr自旋阀中的近邻诱导自旋过滤

Proximity-induced spin filtering in vdW CrSBr spin-valves with ZrTe barriers.

作者信息

Kumari Puja, C V Anusree, Kanchana V

机构信息

Department of Physics, Indian Institute of Technology Hyderabad, Kandi, Medak 502 284, Telangana, India.

出版信息

Phys Chem Chem Phys. 2025 Jul 23. doi: 10.1039/d4cp04559a.

Abstract

Two-dimensional (2D) materials have attracted significant interest for their exceptional physical properties and potential applications in nanoelectronics, spintronics, and optoelectronics. The emergence of van der Waals (vdW) heterostructures has further expanded this field by enabling the integration of complementary 2D layers, resulting in novel functionalities such as tunable band alignment, improved spin transfer, and proximity-induced effects like magnetism and superconductivity, making them ideal for advanced electronic devices. The combination of ferromagnetic semiconductors and semimetals offers new possibilities for exploring spin-polarized currents and improving spin injection efficiency. In this study, we investigate the 2D interface of the semimetal ZrTe and the ferromagnetic semiconductor CrSBr, focusing on their structural, electronic, and magnetic properties using first-principles calculations. Our results show that spin-up carriers dominate, with a spin polarization of approximately 75.08% at the Fermi level. The coupling of CrSBr with a monolayer of ZrTe significantly enhances the magnetic moment of the system due to proximity effects. We further investigate the CrSBr/L-ZrTe/CrSBr spin-valve heterostructure by systematically reducing the ZrTe layer thickness from five layers to a monolayer under parallel (P) and antiparallel (AP) spin alignments. The P configuration exhibits an increased magnetic moment in ZrTe with decreasing thickness, while the AP configuration results in the cancellation of the total magnetic moment. Transport calculations reveal a magnetoresistance (MR) ratio of 495.75% at zero bias for the single-layer ZrTe structure. The ZrTe interface enhances spin injection efficiency to over 90% in both the P and AP configurations under bias voltage, enabling precise control of spin-polarized currents and highly effective spin filtering. This performance remains robust across a wide voltage range, despite the reduction of ZrTe layers from five to one, demonstrating the heterostructure's structural stability and adaptability. These findings establish the CrSBr/ZrTe/CrSBr system as a reliable and scalable platform for high-efficiency spin filtering and magnetic memory devices, positioning it as a promising candidate for next-generation spintronic technologies.

摘要

二维(2D)材料因其优异的物理性质以及在纳米电子学、自旋电子学和光电子学中的潜在应用而备受关注。范德华(vdW)异质结构的出现通过实现互补二维层的集成进一步扩展了这一领域,产生了诸如可调带隙对准、改进的自旋转移以及诸如磁性和超导性等近邻诱导效应等新功能,使其成为先进电子器件的理想选择。铁磁半导体和半金属的结合为探索自旋极化电流和提高自旋注入效率提供了新的可能性。在本研究中,我们研究了半金属ZrTe与铁磁半导体CrSBr的二维界面,使用第一性原理计算重点研究了它们的结构、电子和磁性性质。我们的结果表明,自旋向上的载流子占主导,在费米能级处的自旋极化率约为75.08%。由于近邻效应,CrSBr与单层ZrTe的耦合显著增强了系统的磁矩。我们通过在平行(P)和反平行(AP)自旋排列下将ZrTe层厚度从五层系统地减小到单层,进一步研究了CrSBr/L-ZrTe/CrSBr自旋阀异质结构。P构型中,ZrTe的磁矩随着厚度减小而增加,而AP构型导致总磁矩抵消。输运计算表明,单层ZrTe结构在零偏压下的磁电阻(MR)比为495.75%。在偏置电压下,ZrTe界面在P和AP构型中都将自旋注入效率提高到90%以上,从而能够精确控制自旋极化电流并实现高效自旋过滤。尽管ZrTe层从五层减少到一层,但这种性能在很宽的电压范围内仍然稳健,证明了异质结构的结构稳定性和适应性。这些发现确立了CrSBr/ZrTe/CrSBr系统作为高效自旋过滤和磁存储器件的可靠且可扩展平台,使其成为下一代自旋电子技术的有前途候选者。

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