Maeda Shoichi, Chikami Shunta, Song Subin, Balois-Oguchi Maria Vanessa, Katase Airi, Latag Glenn Villena, Tanaka Takuo, Hayashi Tomohiro
Department of Materials Science and Engineering, School of Materials Science and Chemical Technology, Institute of Science Tokyo, 4259 Nagatsuta-cho, Midori-ku, Yokohama-shi, Kanagawa-ken 226-8502, Japan.
Metaphotonics Research Team, RIKEN Center for Advanced Photonics, Hirosawa, Wako, Saitama 351-0198, Japan.
Anal Chem. 2025 Sep 23;97(37):20156-20163. doi: 10.1021/acs.analchem.5c02765. Epub 2025 Sep 13.
We present an interface-sensitive spectroscopy method that integrates attenuated total reflection infrared absorption (ATR-IR) spectroscopy, a distance control system, and multivariate curve resolution (MCR). In this approach, we adjust the distance between the sample and the ATR prism while collecting a series of spectra that reflect various contributions from both bulk and interfacial regions. Subsequently, we utilize MCR to extract the spectral components specific to the interfacial region. Here, we validate this method through the analysis of interfacial water adjacent to self-assembled monolayers (SAMs), quartz, polymers, and polymer brush films. Our findings are compared with results from other interface-sensitive spectroscopic techniques, confirming the interface sensitivity of our approach. This method does not necessitate surface enhancement or nonlinear optical effects and imposes virtually no restrictions on the types of samples suitable for analysis. Furthermore, it allows us to assess the thickness of the interfacial region using a spectral component distinct from the bulk region, revealing insights into the relationship between the interfacial behavior of molecules and related phenomena. Additionally, this method can be seamlessly integrated into standard ATR-IR spectroscopes, offering a straightforward solution for interface-sensitive spectroscopy.
我们提出了一种界面敏感光谱方法，该方法集成了衰减全反射红外吸收（ATR-IR）光谱、距离控制系统和多元曲线分辨（MCR）。在这种方法中，我们在收集一系列反映本体和界面区域各种贡献的光谱时，调整样品与ATR棱镜之间的距离。随后，我们利用MCR提取界面区域特有的光谱成分。在此，我们通过分析自组装单分子层（SAMs）、石英、聚合物和聚合物刷膜附近的界面水来验证该方法。我们的研究结果与其他界面敏感光谱技术的结果进行了比较，证实了我们方法的界面敏感性。该方法不需要表面增强或非线性光学效应，对适合分析的样品类型几乎没有限制。此外，它使我们能够使用与本体区域不同的光谱成分来评估界面区域的厚度，揭示分子界面行为与相关现象之间的关系。此外，该方法可以无缝集成到标准ATR-IR光谱仪中，为界面敏感光谱提供了一种直接的解决方案。
