Nusynowitz M L, Benedetto A R
Radiology. 1979 Apr;131(1):235-41. doi: 10.1148/131.1.235.
The authors define a mathematically precise index of uniformity (IOU) and show that the IOU is a convenient tool to quantitate uniformity of sensitivity and resolution response for any given area of interest on the detector face. They also show that the IOU is an appropriate factor for weighing the mean values of sensitivity and resolution for nonuniformity of response; these weighted sensitivity and resolution factors are used to derive a weighted figure of merit which takes into account, in a single parameter, the nonuniformities of response inherent in the determination of sensitivity and resolution.
作者定义了一个数学上精确的均匀性指数（IOU），并表明IOU是一种方便的工具，可用于量化探测器表面上任何给定感兴趣区域的灵敏度和分辨率响应的均匀性。他们还表明，IOU是用于权衡灵敏度和分辨率平均值以反映响应不均匀性的合适因子；这些加权的灵敏度和分辨率因子用于推导出一个加权品质因数，该因数在单个参数中考虑了灵敏度和分辨率测定中固有的响应不均匀性。
