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足跟痛综合征:诊断与治疗的基本原理

Painful heel syndrome: rationale of diagnosis and treatment.

作者信息

Graham C E

出版信息

Foot Ankle. 1983 Mar-Apr;3(5):261-7. doi: 10.1177/107110078300300504.

Abstract

Recent developments in isotope imagery have allowed orthopaedic surgeons some insight into stress areas of the skeleton that are not readily seen on routine X-rays. This X-ray imagery has been used in evaluating patients with painful heel syndrome. In 97.7% of the cases, the bone scan was positive on the side of the heel that had the pain. An X-ray technique exposing the painful heel at a 45 degree angle on the medial side with the cassette underneath the foot showed a bony condensation in many of the cases which was thought to represent a fatigue fracture. Based on these bone scans and X-ray findings, a classification system has been devised. A flow chart is described using logical progression in the diagnosis and treatment phase of this problem.

摘要

同位素成像技术的最新进展使骨科医生能够对骨骼的应力区域有所了解,而这些区域在常规X光片上不易看到。这种X光成像已被用于评估足跟疼痛综合征患者。在97.7%的病例中,骨扫描显示疼痛足跟侧呈阳性。一种X光技术是将疼痛的足跟在内侧以45度角曝光,暗盒置于足部下方,在许多病例中显示出骨密度增高,这被认为代表疲劳性骨折。基于这些骨扫描和X光检查结果,设计了一种分类系统。文中描述了一个流程图,用于该问题诊断和治疗阶段的逻辑进展。

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