Plewes D, Johns H E
Med Phys. 1980 Jul-Aug;7(4):315-23. doi: 10.1118/1.594712.
A study of the factors affecting image quality and x-ray sensitivity of ionography and xeroradiography is presented. First, the relative charge sensitivities (nC/cm2mR) are compared. It is shown that high pressure xenon (10 atm cm) as used in ionography produces more than 2.5--3.5 times more charge than the selenium layers used in xeroradiography for the same x-ray exposure. The influence of development time and toner deposition on the appearance of images is investigated theoretically and experimentally. A parameter describing development sensitivity is proposed. It is shown that an increase in development sensitivity (ODcm2/nC) with increasing development time is accompanied by a loss in edge enhancement. The development sensitivity of ionography is about twice that typical of xeroradiography. This makes the total sensitivity (OD/mR) or the ionography process more than 4.5--6.5 times that of xeroradiography. The total sensitivity of ionography is about 1/2 that of par speed film screen combinations.
本文介绍了一项关于影响离子成像和干板X线摄影图像质量及X线敏感度因素的研究。首先，比较了相对电荷敏感度（nC/cm²mR）。结果表明，对于相同的X线曝光量，离子成像中使用的高压氙气（10个大气压厘米）产生的电荷量比干板X线摄影中使用的硒层多2.5至3.5倍以上。从理论和实验两方面研究了显影时间和调色剂沉积对图像外观的影响。提出了一个描述显影敏感度的参数。结果表明，随着显影时间增加，显影敏感度（ODcm²/nC）提高的同时边缘增强效果会损失。离子成像的显影敏感度约为干板X线摄影的两倍。这使得离子成像过程的总敏感度（OD/mR）是干板X线摄影的4.5至6.5倍以上。离子成像的总敏感度约为普通速度胶片-增感屏组合的1/2。
