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Impedance and admittance tympanometry. II. Mathematical approach.

作者信息

Van Camp K J, Vanhuyse V J, Creten W L, Vanpeperstraete P M

出版信息

Audiology. 1978 Mar-Apr;17(2):108-19. doi: 10.3109/00206097809080038.

Abstract

The W-notching of susceptance, conductance and admittance tympanograms, as well as inverted-V shapes, found at high probe tone frequencies are explained, starting from realistic assumptions on the shape of resistance and reactance tympanograms. Necessary conditions for obtaining the different types of tympanograms are given. The theory shows that no pathology is necessary to explain W-notching or inverted-V shapes at higher-frequency probe tones.

摘要

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