Westgard J O, Hyltoft Petersen P, Groth T
Scand J Clin Lab Invest Suppl. 1984;172:229-36.
A quality-costs model has been developed to predict the cost effectiveness of a batch analytical process subject to intermittent analytical errors. The process test yield (the proportion of analytical measurements in an analytical run that are reportable as patient test results) provides a useful measure of the efficiency of an analytical process and can be related to critical characteristics of the measurement and control procedures. Equations are provided to estimate test yield from the measurement procedure's frequency of medically important errors (f) and the control procedure's probabilities for error detection (ped) and false rejection (pfr). Examples illustrate how losses in process output depend on the characteristics of the measurement and control procedures, and how increased control efforts may actually improve the yield of analytical processes when the frequency of errors is high. The test yield formulation of the quality-costs model should aid efforts to provide more cost effective analytical processes.
已开发出一种质量成本模型，用于预测受间歇性分析误差影响的批量分析过程的成本效益。过程测试合格率（一次分析运行中可作为患者测试结果报告的分析测量比例）为分析过程的效率提供了一个有用的衡量标准，并且可以与测量和控制程序的关键特征相关联。文中给出了一些方程式，用于根据测量程序中具有医学重要性的误差频率（f）以及控制程序的误差检测概率（ped）和误判概率（pfr）来估算测试合格率。示例说明了过程产出的损失如何取决于测量和控制程序的特征，以及当误差频率较高时，增加控制力度实际上如何提高分析过程的合格率。质量成本模型的测试合格率公式应有助于努力提供更具成本效益的分析过程。
