Watanabe M, Horikawa M
Mutat Res. 1980 Jul;71(2):219-31. doi: 10.1016/0027-5107(80)90074-3.
8-Azaguanine(8AG)-resistant mutations induced by X-rays, ultraviolet radiation (UV) and a chemical carcinogen, 4-hydroxyaminoquinoline 1-oxide (4-HAQO) were examined during the cell cycle of synchronized HeLa S3 cells. Mutants induced by 400 R of X-rays occurred in a higher frequency in the X-ray-SENSITIVE Gl-S boundary phase than in the X-ray-resistant G1, S and early G2 phases. 8AG-resistant mutants induced by treatment with 10(-5) M 4-HAQO for 20 min appeared in a higher frequency in the early to middle S phases than in the other phases. In the case of UV, however, we found no significant difference in the induced mutation frequencies during the cell cycle, because the mutation frequencies induced by the UV doses (0-20 J/m2) used were too low for detection of the difference. These results suggest that there is a close correlation between the critical damage induced in DNA molecule(s) at the DNA-synthetic phase in the cell cycle and mutagenesis, because mitotic cells have a low mutability in spite of their high radio-sensitivity.
在同步化的HeLa S3细胞的细胞周期中,研究了由X射线、紫外线辐射(UV)和化学致癌物4-羟基氨基喹啉1-氧化物(4-HAQO)诱导产生的8-氮杂鸟嘌呤(8AG)抗性突变。400伦琴X射线诱导产生的突变体,在对X射线敏感的G1-S边界期出现的频率高于对X射线抗性的G1期、S期和G2早期。用10^(-5) M 4-HAQO处理20分钟诱导产生的8AG抗性突变体,在S期早期到中期出现的频率高于其他时期。然而,就紫外线而言,我们发现在细胞周期中诱导的突变频率没有显著差异,因为所使用的紫外线剂量(0-20 J/m²)诱导的突变频率过低,无法检测到差异。这些结果表明,细胞周期中DNA合成期DNA分子中诱导的关键损伤与诱变之间存在密切相关性,因为有丝分裂细胞尽管具有高辐射敏感性,但诱变率较低。