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上丘-脑桥轴突终末的电子显微镜鉴定

Electron microscopic identification of superior colliculo-pontine axon terminals.

作者信息

Watt C B, Mihailoff G A

出版信息

Neurosci Lett. 1983 Jan 31;35(1):7-13. doi: 10.1016/0304-3940(83)90518-9.

DOI:10.1016/0304-3940(83)90518-9
PMID:6843892
Abstract

Synaptic boutons emanating from axons of superior colliculus origin were identified by electron microscopy in the neuropil of the basilar pontine nuclei. Such boutons were relatively small (0.6-2.0 microns) and exhibited electron-dense degeneration within a 1-2 day period following electrolytic lesions which involved much of the superior colliculus. Degenerating boutons were observed in synaptic contact with dendritic shafts and spines as well as neuronal somata. The reactive boutons were rapidly engulfed by phagocytic elements and were no longer visible in the neuropil after 6 days of survival.

摘要

通过电子显微镜在脑桥基底核的神经毡中鉴定出来自上丘起源轴突的突触终扣。这类终扣相对较小(0.6 - 2.0微米),并且在涉及大部分上丘的电解损伤后1 - 2天内呈现电子致密性退变。观察到退变的终扣与树突干、树突棘以及神经元胞体形成突触联系。这些反应性终扣迅速被吞噬细胞吞噬,存活6天后在神经毡中不再可见。

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