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不同汞含量的高铜汞合金中γ2(锡-汞)相的X射线衍射分析

X-ray diffraction analysis of gamma 2 (Sn-Hg) phase in higher copper amalgams of varying mercury content.

作者信息

Malhotra M L, Asgar K

出版信息

J Dent Res. 1981 Feb;60(2):149-53. doi: 10.1177/00220345810600021001.

Abstract

Microstructures of high copper commercial amalgams containing varying amounts of mercury, ranging from 20% above to 25% below recommended values, were primarily investigated by x-ray diffraction. Mechanisms relating to the absence or presence of gamma 2 (Sn-Hg) phase in these amalgams were discussed in relation to the presence of copper and tin elements in their original alloys. The optimum mercury concentration in some amalgams was determined in order to keep them free of the gamma 2 (Sn-Hg) phase.

摘要

对汞含量在推荐值上下浮动20%至25%范围内的高铜商用汞合金的微观结构进行了主要基于X射线衍射的研究。针对这些汞合金中γ2(锡 - 汞)相的有无,结合其原始合金中铜和锡元素的存在情况进行了相关机制的讨论。为使某些汞合金不含γ2(锡 - 汞)相,确定了其最佳汞浓度。

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