Evers P, Robinson K, Maistry L, Higginson E
J Microsc. 1980 Nov;120(Pt 2):225-8. doi: 10.1111/j.1365-2818.1980.tb04141.x.
The elimination of artefact during the preparation of cell cultures for scanning electron microscopy is difficult. Collapse of cellular projections, cytoplasmic cracks, perforations and fracturing of cell-cell processes and cell-substrate attachments occur during fixation, dehydration and critical point drying. Coating and storage may cause further artefact. A specimen holder which serves to minimize turbulence in the critical point dryer and which allows for the simultaneous processing of up to five coverslips, as well as a reproducible technique for the preparation of cell cultures are described.