Cosslett V E
J Microsc. 1982 Oct;128(Pt 1):23-31. doi: 10.1111/j.1365-2818.1982.tb00434.x.
The development of quantitative interpretation of electron micrographs, in respect of contrast as well as resolution, has followed similar lines to those in optical microscopy, though on a faster time scale. A thorough understanding of phase contrast came relatively late in both disciplines. The definition of resolution is more complicated in the case of the electron image on account of the severe effect of lens aberrations, especially spherical aberration. Experimental measurement of the performance of an electron microscope requires an operational definition of resolving power, which must include contrast considerations as well as the limitations imposed by lack of spatial and temporal coherence of the electron source. Agreement on suitable test procedures is now being reached, at least for a very thin specimen.