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两种用于电子显微镜形态测量的子采样方法的比较。

Comparison of two subsampling methods for electron microscopic morphometry.

作者信息

Müller A E, Cruz-Orive L M, Gehr P, Weibel E R

出版信息

J Microsc. 1981 Jul;123(Pt 1):35-49. doi: 10.1111/j.1365-2818.1981.tb01278.x.

Abstract

The purpose of the present paper is twofold. Firstly, to compare the accuracy per unit cost achieved by two different methods of subsampling micrographs from sections of a material for stereology when the sections cannot be analysed as a whole at the required magnification. Secondly, to illustrate, by means of real data, the application of some of the methods and formulae proposed in the companion paper (Cruz-Orive & Weibel, 1981) for estimating ratios at the electron microscopic level. The final estimates of a same ratio obtained by either subsampling method (namely systematic (SQ) and systematic area-weighted quadrats (SAWQ)) agreed in the mean and they were about equally precise. The former fact indicates that the new SAWQ method is at least as reliable as the SQ method as far as bias is concerned. The latter result is a consequence of the well-known fact that subsampling is relatively unimportant in two-stage sampling. Yet, SAWQ subsampling enjoys definite practical advantages over other subsampling methods in certain situations.

摘要

本文目的有二。其一,当材料切片无法在所需放大倍数下整体分析时,比较两种不同的从材料切片显微照片中进行子采样的方法在单位成本下的准确性,用于体视学研究。其二,通过实际数据说明在配套论文(Cruz - Orive & Weibel,1981)中提出的一些用于在电子显微镜水平估计比率的方法和公式的应用。通过任何一种子采样方法(即系统采样(SQ)和系统面积加权样方(SAWQ))获得的同一比率的最终估计值在均值上是一致的,并且它们的精度大致相同。前一事实表明,就偏差而言,新的SAWQ方法至少与SQ方法一样可靠。后一结果是由于众所周知的事实,即在两阶段采样中,子采样相对不太重要。然而,在某些情况下,SAWQ子采样相对于其他子采样方法具有明确的实际优势。

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